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Infrared spectroscopic ellipsometry and optical spectroscopy of plasmons in classic 3D topological insulators. / Mamedov, Nazim T.; Alizade, Elvin H.; Jahangirli, Zakir A.; Aliev, Ziya S.; Abdullayev, Nadir A.; Mammadov, Samir N.; Amiraslanov, Imamaddin R.; Shim, Yong Gu; Wakita, Kazuki; Ragimov, Sadiyar S.; Bayramov, Ayaz I.; Babanly, Mahammad B.; Shikin, Alexander M.; Chulkov, Evgueni V.

в: Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics, Том 37, № 6, 062602, 01.11.2019.

Результаты исследований: Научные публикации в периодических изданияхстатьяРецензирование

Harvard

Mamedov, NT, Alizade, EH, Jahangirli, ZA, Aliev, ZS, Abdullayev, NA, Mammadov, SN, Amiraslanov, IR, Shim, YG, Wakita, K, Ragimov, SS, Bayramov, AI, Babanly, MB, Shikin, AM & Chulkov, EV 2019, 'Infrared spectroscopic ellipsometry and optical spectroscopy of plasmons in classic 3D topological insulators', Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics, Том. 37, № 6, 062602. https://doi.org/10.1116/1.5122776

APA

Mamedov, N. T., Alizade, E. H., Jahangirli, Z. A., Aliev, Z. S., Abdullayev, N. A., Mammadov, S. N., Amiraslanov, I. R., Shim, Y. G., Wakita, K., Ragimov, S. S., Bayramov, A. I., Babanly, M. B., Shikin, A. M., & Chulkov, E. V. (2019). Infrared spectroscopic ellipsometry and optical spectroscopy of plasmons in classic 3D topological insulators. Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics, 37(6), [062602]. https://doi.org/10.1116/1.5122776

Vancouver

Mamedov NT, Alizade EH, Jahangirli ZA, Aliev ZS, Abdullayev NA, Mammadov SN и пр. Infrared spectroscopic ellipsometry and optical spectroscopy of plasmons in classic 3D topological insulators. Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics. 2019 Нояб. 1;37(6). 062602. https://doi.org/10.1116/1.5122776

Author

Mamedov, Nazim T. ; Alizade, Elvin H. ; Jahangirli, Zakir A. ; Aliev, Ziya S. ; Abdullayev, Nadir A. ; Mammadov, Samir N. ; Amiraslanov, Imamaddin R. ; Shim, Yong Gu ; Wakita, Kazuki ; Ragimov, Sadiyar S. ; Bayramov, Ayaz I. ; Babanly, Mahammad B. ; Shikin, Alexander M. ; Chulkov, Evgueni V. / Infrared spectroscopic ellipsometry and optical spectroscopy of plasmons in classic 3D topological insulators. в: Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics. 2019 ; Том 37, № 6.

BibTeX

@article{028e201177d745ab82be0f08ab35c2a6,
title = "Infrared spectroscopic ellipsometry and optical spectroscopy of plasmons in classic 3D topological insulators",
abstract = "Narrow bandgap Bi2Se3, Bi2Te3, and Sb2Te3, commonly referred to as classic 3D topological insulators, were studied at room temperature by spectroscopic ellipsometry and optical reflection spectroscopy over the mid-IR-near-infrared photon energy range. Complementarily, Hall measurements were performed. Plasmons in optical loss function and reflection coefficient were identified. The conventional approach based on the high frequency dielectric constant was shown to work well in the description of plasmons in Bi2Se3 and Sb2Te3 and to fail in the case of a similar compound, Bi2Te3. The obtained results are discussed in terms of single- and multivalley approaches to the studied samples with taking the details of the calculated band structure into account.",
author = "Mamedov, {Nazim T.} and Alizade, {Elvin H.} and Jahangirli, {Zakir A.} and Aliev, {Ziya S.} and Abdullayev, {Nadir A.} and Mammadov, {Samir N.} and Amiraslanov, {Imamaddin R.} and Shim, {Yong Gu} and Kazuki Wakita and Ragimov, {Sadiyar S.} and Bayramov, {Ayaz I.} and Babanly, {Mahammad B.} and Shikin, {Alexander M.} and Chulkov, {Evgueni V.}",
year = "2019",
month = nov,
day = "1",
doi = "10.1116/1.5122776",
language = "English",
volume = "37",
journal = "Journal of Vacuum Science and Technology B",
issn = "2166-2746",
publisher = "AVS Science and Technology Society",
number = "6",

}

RIS

TY - JOUR

T1 - Infrared spectroscopic ellipsometry and optical spectroscopy of plasmons in classic 3D topological insulators

AU - Mamedov, Nazim T.

AU - Alizade, Elvin H.

AU - Jahangirli, Zakir A.

AU - Aliev, Ziya S.

AU - Abdullayev, Nadir A.

AU - Mammadov, Samir N.

AU - Amiraslanov, Imamaddin R.

AU - Shim, Yong Gu

AU - Wakita, Kazuki

AU - Ragimov, Sadiyar S.

AU - Bayramov, Ayaz I.

AU - Babanly, Mahammad B.

AU - Shikin, Alexander M.

AU - Chulkov, Evgueni V.

PY - 2019/11/1

Y1 - 2019/11/1

N2 - Narrow bandgap Bi2Se3, Bi2Te3, and Sb2Te3, commonly referred to as classic 3D topological insulators, were studied at room temperature by spectroscopic ellipsometry and optical reflection spectroscopy over the mid-IR-near-infrared photon energy range. Complementarily, Hall measurements were performed. Plasmons in optical loss function and reflection coefficient were identified. The conventional approach based on the high frequency dielectric constant was shown to work well in the description of plasmons in Bi2Se3 and Sb2Te3 and to fail in the case of a similar compound, Bi2Te3. The obtained results are discussed in terms of single- and multivalley approaches to the studied samples with taking the details of the calculated band structure into account.

AB - Narrow bandgap Bi2Se3, Bi2Te3, and Sb2Te3, commonly referred to as classic 3D topological insulators, were studied at room temperature by spectroscopic ellipsometry and optical reflection spectroscopy over the mid-IR-near-infrared photon energy range. Complementarily, Hall measurements were performed. Plasmons in optical loss function and reflection coefficient were identified. The conventional approach based on the high frequency dielectric constant was shown to work well in the description of plasmons in Bi2Se3 and Sb2Te3 and to fail in the case of a similar compound, Bi2Te3. The obtained results are discussed in terms of single- and multivalley approaches to the studied samples with taking the details of the calculated band structure into account.

UR - http://www.scopus.com/inward/record.url?scp=85075269765&partnerID=8YFLogxK

U2 - 10.1116/1.5122776

DO - 10.1116/1.5122776

M3 - Article

AN - SCOPUS:85075269765

VL - 37

JO - Journal of Vacuum Science and Technology B

JF - Journal of Vacuum Science and Technology B

SN - 2166-2746

IS - 6

M1 - 062602

ER -

ID: 61016565