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Indirect Detection of the Light Emission in the Local Tunnel Junction. / Lebedev, Denis V.; Mozharov, Alexey M.; Bolshakov, Alexey D.; Shkoldin, Vitaliy A.; Permyakov, Dmitry V.; Golubok, Alexander O.; Samusev, Anton K.; Mukhin, Ivan S.

в: Physica Status Solidi - Rapid Research Letters, Том 14, № 3, 1900607, 01.01.2019.

Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование

Harvard

Lebedev, DV, Mozharov, AM, Bolshakov, AD, Shkoldin, VA, Permyakov, DV, Golubok, AO, Samusev, AK & Mukhin, IS 2019, 'Indirect Detection of the Light Emission in the Local Tunnel Junction', Physica Status Solidi - Rapid Research Letters, Том. 14, № 3, 1900607. https://doi.org/10.1002/pssr.201900607

APA

Lebedev, D. V., Mozharov, A. M., Bolshakov, A. D., Shkoldin, V. A., Permyakov, D. V., Golubok, A. O., Samusev, A. K., & Mukhin, I. S. (Принято в печать). Indirect Detection of the Light Emission in the Local Tunnel Junction. Physica Status Solidi - Rapid Research Letters, 14(3), [1900607]. https://doi.org/10.1002/pssr.201900607

Vancouver

Lebedev DV, Mozharov AM, Bolshakov AD, Shkoldin VA, Permyakov DV, Golubok AO и пр. Indirect Detection of the Light Emission in the Local Tunnel Junction. Physica Status Solidi - Rapid Research Letters. 2019 Янв. 1;14(3). 1900607. https://doi.org/10.1002/pssr.201900607

Author

Lebedev, Denis V. ; Mozharov, Alexey M. ; Bolshakov, Alexey D. ; Shkoldin, Vitaliy A. ; Permyakov, Dmitry V. ; Golubok, Alexander O. ; Samusev, Anton K. ; Mukhin, Ivan S. / Indirect Detection of the Light Emission in the Local Tunnel Junction. в: Physica Status Solidi - Rapid Research Letters. 2019 ; Том 14, № 3.

BibTeX

@article{86f270f51b1a4706a7a86c04079d9ea6,
title = "Indirect Detection of the Light Emission in the Local Tunnel Junction",
abstract = "Herein, I(V) characteristics of the tunnel junction between the scanning tunneling microscopy (STM) Pt/Ir probe and atomically flat Au film on mica using ultrahigh vacuum STM is investigated. To ensure cleanness and flatness of the Au films, optimization of the substrate annealing and Ar plasma treatment are performed. The obtained technological parameters allow to drastically improve the reproducibility of I(V) measurements. The analysis of I(V), d2I/dV2 (V), and Fowler–Nordheim plots is conducted, and the presence of the features in the bias region near 1.8 V in the form of peak and minimum, peak and anomalous extra minimum, respectively is demonstrated. The direct optical measurements confirm that the features on I(V) curves are associated with the generation of photons from the STM probe-sample gap, governed by inelastic tunneling processes. The proposed I(V) analysis approach is used for indirect sensing and investigation of the light emission in the tunnel junction offering a powerful tool for the studies of the photonic sources with deeply subwavelength dimensions.",
keywords = "I(V) characteristics, inelastic electron tunneling, photons generation, scanning tunneling microscopy, tunnel junctions",
author = "Lebedev, {Denis V.} and Mozharov, {Alexey M.} and Bolshakov, {Alexey D.} and Shkoldin, {Vitaliy A.} and Permyakov, {Dmitry V.} and Golubok, {Alexander O.} and Samusev, {Anton K.} and Mukhin, {Ivan S.}",
year = "2019",
month = jan,
day = "1",
doi = "10.1002/pssr.201900607",
language = "English",
volume = "14",
journal = "Physica Status Solidi - Rapid Research Letetrs",
issn = "1862-6254",
publisher = "Wiley-Blackwell",
number = "3",

}

RIS

TY - JOUR

T1 - Indirect Detection of the Light Emission in the Local Tunnel Junction

AU - Lebedev, Denis V.

AU - Mozharov, Alexey M.

AU - Bolshakov, Alexey D.

AU - Shkoldin, Vitaliy A.

AU - Permyakov, Dmitry V.

AU - Golubok, Alexander O.

AU - Samusev, Anton K.

AU - Mukhin, Ivan S.

PY - 2019/1/1

Y1 - 2019/1/1

N2 - Herein, I(V) characteristics of the tunnel junction between the scanning tunneling microscopy (STM) Pt/Ir probe and atomically flat Au film on mica using ultrahigh vacuum STM is investigated. To ensure cleanness and flatness of the Au films, optimization of the substrate annealing and Ar plasma treatment are performed. The obtained technological parameters allow to drastically improve the reproducibility of I(V) measurements. The analysis of I(V), d2I/dV2 (V), and Fowler–Nordheim plots is conducted, and the presence of the features in the bias region near 1.8 V in the form of peak and minimum, peak and anomalous extra minimum, respectively is demonstrated. The direct optical measurements confirm that the features on I(V) curves are associated with the generation of photons from the STM probe-sample gap, governed by inelastic tunneling processes. The proposed I(V) analysis approach is used for indirect sensing and investigation of the light emission in the tunnel junction offering a powerful tool for the studies of the photonic sources with deeply subwavelength dimensions.

AB - Herein, I(V) characteristics of the tunnel junction between the scanning tunneling microscopy (STM) Pt/Ir probe and atomically flat Au film on mica using ultrahigh vacuum STM is investigated. To ensure cleanness and flatness of the Au films, optimization of the substrate annealing and Ar plasma treatment are performed. The obtained technological parameters allow to drastically improve the reproducibility of I(V) measurements. The analysis of I(V), d2I/dV2 (V), and Fowler–Nordheim plots is conducted, and the presence of the features in the bias region near 1.8 V in the form of peak and minimum, peak and anomalous extra minimum, respectively is demonstrated. The direct optical measurements confirm that the features on I(V) curves are associated with the generation of photons from the STM probe-sample gap, governed by inelastic tunneling processes. The proposed I(V) analysis approach is used for indirect sensing and investigation of the light emission in the tunnel junction offering a powerful tool for the studies of the photonic sources with deeply subwavelength dimensions.

KW - I(V) characteristics

KW - inelastic electron tunneling

KW - photons generation

KW - scanning tunneling microscopy

KW - tunnel junctions

UR - http://www.scopus.com/inward/record.url?scp=85076106561&partnerID=8YFLogxK

U2 - 10.1002/pssr.201900607

DO - 10.1002/pssr.201900607

M3 - Article

AN - SCOPUS:85076106561

VL - 14

JO - Physica Status Solidi - Rapid Research Letetrs

JF - Physica Status Solidi - Rapid Research Letetrs

SN - 1862-6254

IS - 3

M1 - 1900607

ER -

ID: 51916576