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Improving precision of X-ray fluorescence analysis of lanthanide mixtures using partial least squares regression. / Kirsanov, D.; Panchuk, V.; Goydenko, A.; Khaydukova, M.; Semenov, V.; Legin, A.

в: Spectrochimica Acta, Part B: Atomic Spectroscopy, Том 113, 2015, стр. 126-131.

Результаты исследований: Научные публикации в периодических изданиях › статья

Harvard

Kirsanov, D, Panchuk, V, Goydenko, A, Khaydukova, M, Semenov, V & Legin, A 2015, 'Improving precision of X-ray fluorescence analysis of lanthanide mixtures using partial least squares regression', Spectrochimica Acta, Part B: Atomic Spectroscopy, Том. 113, стр. 126-131. https://doi.org/10.1016/j.sab.2015.09.013

APA

Kirsanov, D., Panchuk, V., Goydenko, A., Khaydukova, M., Semenov, V., & Legin, A. (2015). Improving precision of X-ray fluorescence analysis of lanthanide mixtures using partial least squares regression. Spectrochimica Acta, Part B: Atomic Spectroscopy, 113, 126-131. https://doi.org/10.1016/j.sab.2015.09.013

Vancouver

Kirsanov D, Panchuk V, Goydenko A, Khaydukova M, Semenov V, Legin A. Improving precision of X-ray fluorescence analysis of lanthanide mixtures using partial least squares regression. Spectrochimica Acta, Part B: Atomic Spectroscopy. 2015;113:126-131. https://doi.org/10.1016/j.sab.2015.09.013

Author

Kirsanov, D. ; Panchuk, V. ; Goydenko, A. ; Khaydukova, M. ; Semenov, V. ; Legin, A. / Improving precision of X-ray fluorescence analysis of lanthanide mixtures using partial least squares regression. в: Spectrochimica Acta, Part B: Atomic Spectroscopy. 2015 ; Том 113. стр. 126-131.

BibTeX

@article{1e01ed3a745c4ee28d1f2622a664276f,
title = "Improving precision of X-ray fluorescence analysis of lanthanide mixtures using partial least squares regression",
abstract = "This study addresses the problem of simultaneous quantitative analysis of six lanthanides (Ce, Pr, Nd, Sm, Eu, Gd) in mixed solutions by two different X-ray fluorescence techniques: energy-dispersive (EDX) and total reflection (TXRF). Concentration of each lanthanide was varied in the range 10−6 –10−3 mol/L, low values being around the detection limit of the method. This resulted in XRF spectra with very poor signal to noise ratio and overlapping bands in case of EDX, while only the latter problem was observed for TXRF. It was shown that ordinary least squares approach in numerical calibration fails to provide for reasonable precision in quantification of individual lanthanides. Partial least squares (PLS) regression was able to circumvent spectral inferiorities and yielded adequate calibration models for both techniques with RMSEP (root mean squared error of prediction) values around 10−5 mol/L. It was demonstrated that comparatively simple and inexpensive EDX method is capable of ensuring the similar precis",
keywords = "EDX, TXRF, Lanthanides, Rare earth metals, PLS regression",
author = "D. Kirsanov and V. Panchuk and A. Goydenko and M. Khaydukova and V. Semenov and A. Legin",
year = "2015",
doi = "10.1016/j.sab.2015.09.013",
language = "English",
volume = "113",
pages = "126--131",
journal = "SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY",
issn = "0584-8547",
publisher = "Elsevier",

}

RIS

TY - JOUR

T1 - Improving precision of X-ray fluorescence analysis of lanthanide mixtures using partial least squares regression

AU - Kirsanov, D.

AU - Panchuk, V.

AU - Goydenko, A.

AU - Khaydukova, M.

AU - Semenov, V.

AU - Legin, A.

PY - 2015

Y1 - 2015

N2 - This study addresses the problem of simultaneous quantitative analysis of six lanthanides (Ce, Pr, Nd, Sm, Eu, Gd) in mixed solutions by two different X-ray fluorescence techniques: energy-dispersive (EDX) and total reflection (TXRF). Concentration of each lanthanide was varied in the range 10−6 –10−3 mol/L, low values being around the detection limit of the method. This resulted in XRF spectra with very poor signal to noise ratio and overlapping bands in case of EDX, while only the latter problem was observed for TXRF. It was shown that ordinary least squares approach in numerical calibration fails to provide for reasonable precision in quantification of individual lanthanides. Partial least squares (PLS) regression was able to circumvent spectral inferiorities and yielded adequate calibration models for both techniques with RMSEP (root mean squared error of prediction) values around 10−5 mol/L. It was demonstrated that comparatively simple and inexpensive EDX method is capable of ensuring the similar precis

AB - This study addresses the problem of simultaneous quantitative analysis of six lanthanides (Ce, Pr, Nd, Sm, Eu, Gd) in mixed solutions by two different X-ray fluorescence techniques: energy-dispersive (EDX) and total reflection (TXRF). Concentration of each lanthanide was varied in the range 10−6 –10−3 mol/L, low values being around the detection limit of the method. This resulted in XRF spectra with very poor signal to noise ratio and overlapping bands in case of EDX, while only the latter problem was observed for TXRF. It was shown that ordinary least squares approach in numerical calibration fails to provide for reasonable precision in quantification of individual lanthanides. Partial least squares (PLS) regression was able to circumvent spectral inferiorities and yielded adequate calibration models for both techniques with RMSEP (root mean squared error of prediction) values around 10−5 mol/L. It was demonstrated that comparatively simple and inexpensive EDX method is capable of ensuring the similar precis

KW - EDX

KW - TXRF

KW - Lanthanides

KW - Rare earth metals

KW - PLS regression

U2 - 10.1016/j.sab.2015.09.013

DO - 10.1016/j.sab.2015.09.013

M3 - Article

VL - 113

SP - 126

EP - 131

JO - SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY

JF - SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY

SN - 0584-8547

ER -

ID: 3975496