Результаты исследований: Публикации в книгах, отчётах, сборниках, трудах конференций › статья в сборнике материалов конференции › научная › Рецензирование
Improving circuit size upper bounds using SAT-solvers. / Kulikov, Alexander S.
Proceedings of the 2018 Design, Automation and Test in Europe Conference and Exhibition, DATE 2018. Institute of Electrical and Electronics Engineers Inc., 2018. стр. 305-308 (Proceedings of the 2018 Design, Automation and Test in Europe Conference and Exhibition, DATE 2018; Том 2018-January).Результаты исследований: Публикации в книгах, отчётах, сборниках, трудах конференций › статья в сборнике материалов конференции › научная › Рецензирование
}
TY - GEN
T1 - Improving circuit size upper bounds using SAT-solvers
AU - Kulikov, Alexander S.
PY - 2018/4/19
Y1 - 2018/4/19
N2 - Boolean circuits is arguably the most natural model for computing Boolean functions. Despite intensive research, for many functions, we still do not know what optimal circuits look like. In this paper, we discuss how SAT-solvers can be used for constructing optimal circuits for functions on moderate number of variables. We first discuss why this problem is important and then indicate the current frontiers: what can and cannot be found by state-of-The-Art SAT-solvers, and for what functions we are interested in finding efficient circuits.
AB - Boolean circuits is arguably the most natural model for computing Boolean functions. Despite intensive research, for many functions, we still do not know what optimal circuits look like. In this paper, we discuss how SAT-solvers can be used for constructing optimal circuits for functions on moderate number of variables. We first discuss why this problem is important and then indicate the current frontiers: what can and cannot be found by state-of-The-Art SAT-solvers, and for what functions we are interested in finding efficient circuits.
UR - http://www.scopus.com/inward/record.url?scp=85048895793&partnerID=8YFLogxK
U2 - 10.23919/DATE.2018.8342026
DO - 10.23919/DATE.2018.8342026
M3 - Conference contribution
AN - SCOPUS:85048895793
T3 - Proceedings of the 2018 Design, Automation and Test in Europe Conference and Exhibition, DATE 2018
SP - 305
EP - 308
BT - Proceedings of the 2018 Design, Automation and Test in Europe Conference and Exhibition, DATE 2018
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2018 Design, Automation and Test in Europe Conference and Exhibition, DATE 2018
Y2 - 19 March 2018 through 23 March 2018
ER -
ID: 49820586