Standard

Impact of Electric Field on Thermoemission of Carriers from Shallow Dislocation-Related Electronic States. / Trushin, M.; Vyvenko, O.F.

Impact of Electric Field on Thermoemission of Carriers from Shallow Dislocation-Related Electronic States. 2014. стр. 299-304.

Результаты исследований: Публикации в книгах, отчётах, сборниках, трудах конференций › статья в сборнике материалов конференции

Harvard

Trushin, M & Vyvenko, OF 2014, Impact of Electric Field on Thermoemission of Carriers from Shallow Dislocation-Related Electronic States. в Impact of Electric Field on Thermoemission of Carriers from Shallow Dislocation-Related Electronic States. стр. 299-304. https://doi.org/10.4028/www.scientific.net/SSP.205-206.299

APA

Trushin, M., & Vyvenko, O. F. (2014). Impact of Electric Field on Thermoemission of Carriers from Shallow Dislocation-Related Electronic States. в Impact of Electric Field on Thermoemission of Carriers from Shallow Dislocation-Related Electronic States (стр. 299-304) https://doi.org/10.4028/www.scientific.net/SSP.205-206.299

Vancouver

Trushin M, Vyvenko OF. Impact of Electric Field on Thermoemission of Carriers from Shallow Dislocation-Related Electronic States. в Impact of Electric Field on Thermoemission of Carriers from Shallow Dislocation-Related Electronic States. 2014. стр. 299-304 https://doi.org/10.4028/www.scientific.net/SSP.205-206.299

Author

Trushin, M. ; Vyvenko, O.F. / Impact of Electric Field on Thermoemission of Carriers from Shallow Dislocation-Related Electronic States. Impact of Electric Field on Thermoemission of Carriers from Shallow Dislocation-Related Electronic States. 2014. стр. 299-304

BibTeX

@inproceedings{4d03c9e3ba184f2da9a594648903e2f5,
title = "Impact of Electric Field on Thermoemission of Carriers from Shallow Dislocation-Related Electronic States",
author = "M. Trushin and O.F. Vyvenko",
year = "2014",
doi = "10.4028/www.scientific.net/SSP.205-206.299",
language = "English",
isbn = "9783037858240",
pages = "299--304",
booktitle = "Impact of Electric Field on Thermoemission of Carriers from Shallow Dislocation-Related Electronic States",

}

RIS

TY - GEN

T1 - Impact of Electric Field on Thermoemission of Carriers from Shallow Dislocation-Related Electronic States

AU - Trushin, M.

AU - Vyvenko, O.F.

PY - 2014

Y1 - 2014

U2 - 10.4028/www.scientific.net/SSP.205-206.299

DO - 10.4028/www.scientific.net/SSP.205-206.299

M3 - Conference contribution

SN - 9783037858240

SP - 299

EP - 304

BT - Impact of Electric Field on Thermoemission of Carriers from Shallow Dislocation-Related Electronic States

ER -

ID: 7004643