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Identification of Field-Emission Images as “Spotty Pictures”. / Egorov, N. V.; Karpov, A. G.; Klemeshev, V. A.

в: Journal of Surface Investigation, Том 12, № 6, 01.11.2018, стр. 1200-1205.

Результаты исследований: Научные публикации в периодических изданияхстатьяРецензирование

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Egorov, N. V. ; Karpov, A. G. ; Klemeshev, V. A. / Identification of Field-Emission Images as “Spotty Pictures”. в: Journal of Surface Investigation. 2018 ; Том 12, № 6. стр. 1200-1205.

BibTeX

@article{bf3d63b8217342e895c5104fad2f7bdb,
title = "Identification of Field-Emission Images as “Spotty Pictures”",
abstract = "Abstract: In this work we propose and implement an algorithm for identifying field-emission images with the aim of determining the crystallographic orientation of an emitter and obtaining detailed information about the structural features of its surface. A threshold-type analysis of the brightness distribution in the image is found to be preferable for selecting information-containing areas and their contours. An original algorithm is proposed for selecting the mask of a “spot” of arbitrary shape. The proposed algorithm of processing the information area is also applicable to “skeletons”; however, the contour of an information fragment should not contain more than one gap. In contrast to the skeletons, the use of internal areas of emission “spots” by means of determining geometric moments improves the reliability of processing results due to an increase in sampled information.",
keywords = "field electron emission, geometric moments of an image, identification of image areas",
author = "Egorov, {N. V.} and Karpov, {A. G.} and Klemeshev, {V. A.}",
year = "2018",
month = nov,
day = "1",
doi = "10.1134/S1027451018050567",
language = "English",
volume = "12",
pages = "1200--1205",
journal = "ПОВЕРХНОСТЬ. РЕНТГЕНОВСКИЕ, СИНХРОТРОННЫЕ И НЕЙТРОННЫЕ ИССЛЕДОВАНИЯ",
issn = "1027-4510",
publisher = "МАИК {"}Наука/Интерпериодика{"}",
number = "6",

}

RIS

TY - JOUR

T1 - Identification of Field-Emission Images as “Spotty Pictures”

AU - Egorov, N. V.

AU - Karpov, A. G.

AU - Klemeshev, V. A.

PY - 2018/11/1

Y1 - 2018/11/1

N2 - Abstract: In this work we propose and implement an algorithm for identifying field-emission images with the aim of determining the crystallographic orientation of an emitter and obtaining detailed information about the structural features of its surface. A threshold-type analysis of the brightness distribution in the image is found to be preferable for selecting information-containing areas and their contours. An original algorithm is proposed for selecting the mask of a “spot” of arbitrary shape. The proposed algorithm of processing the information area is also applicable to “skeletons”; however, the contour of an information fragment should not contain more than one gap. In contrast to the skeletons, the use of internal areas of emission “spots” by means of determining geometric moments improves the reliability of processing results due to an increase in sampled information.

AB - Abstract: In this work we propose and implement an algorithm for identifying field-emission images with the aim of determining the crystallographic orientation of an emitter and obtaining detailed information about the structural features of its surface. A threshold-type analysis of the brightness distribution in the image is found to be preferable for selecting information-containing areas and their contours. An original algorithm is proposed for selecting the mask of a “spot” of arbitrary shape. The proposed algorithm of processing the information area is also applicable to “skeletons”; however, the contour of an information fragment should not contain more than one gap. In contrast to the skeletons, the use of internal areas of emission “spots” by means of determining geometric moments improves the reliability of processing results due to an increase in sampled information.

KW - field electron emission

KW - geometric moments of an image

KW - identification of image areas

UR - http://www.scopus.com/inward/record.url?scp=85062635740&partnerID=8YFLogxK

U2 - 10.1134/S1027451018050567

DO - 10.1134/S1027451018050567

M3 - Article

AN - SCOPUS:85062635740

VL - 12

SP - 1200

EP - 1205

JO - ПОВЕРХНОСТЬ. РЕНТГЕНОВСКИЕ, СИНХРОТРОННЫЕ И НЕЙТРОННЫЕ ИССЛЕДОВАНИЯ

JF - ПОВЕРХНОСТЬ. РЕНТГЕНОВСКИЕ, СИНХРОТРОННЫЕ И НЕЙТРОННЫЕ ИССЛЕДОВАНИЯ

SN - 1027-4510

IS - 6

ER -

ID: 41238857