Rate constants of formation of Xe2 excimers in the first excited 0+u and 1u molecular states were measured in low-presser (5-12 Torr) low-current (3 mA) glow discharge in neat xenon. Concentrations of the lowest excited 0+u and 1u molecular states were measured with vacuum ultraviolet emission spectroscopy in the wavelength region 147-220 nm. Concentrations of the respective excited atomic states were estimated with infrared absorption at the Xe electronic transition wavelengths 881.9 nm and 828.0 nm. The formation rate constants Kf (0^+_u) = 4*10^(−32) cm^6/s and Kf (1_u) = 0.3*10^(−32) cm^6/s were obtained from a pressure dependence of the atomic and molecular concentrations.