Standard

FIELD EMISSION SPECTROSCOPY OF SILICON CARBIDE: NATURAL MODELLING. / Nikiforov, Konstantin; Trofimov, Vasiliy; Egorov, Nikolay.

2015 INTERNATIONAL CONFERENCE "STABILITY AND CONTROL PROCESSES" IN MEMORY OF V.I. ZUBOV (SCP). Institute of Electrical and Electronics Engineers Inc., 2015. стр. 180-182.

Результаты исследований: Публикации в книгах, отчётах, сборниках, трудах конференций › статья в сборнике материалов конференции › научная

Harvard

Nikiforov, K, Trofimov, V & Egorov, N 2015, FIELD EMISSION SPECTROSCOPY OF SILICON CARBIDE: NATURAL MODELLING. в 2015 INTERNATIONAL CONFERENCE "STABILITY AND CONTROL PROCESSES" IN MEMORY OF V.I. ZUBOV (SCP). Institute of Electrical and Electronics Engineers Inc., стр. 180-182, III Международная конференция "Устойчивость и процессы управления", посвященная 85-летию со дня рождения чл.-корр. РАН В.И. Зубова, St. Petersburg, Российская Федерация, 5/10/15. https://doi.org/10.1109/SCP.2015.7342085

APA

Nikiforov, K., Trofimov, V., & Egorov, N. (2015). FIELD EMISSION SPECTROSCOPY OF SILICON CARBIDE: NATURAL MODELLING. в 2015 INTERNATIONAL CONFERENCE "STABILITY AND CONTROL PROCESSES" IN MEMORY OF V.I. ZUBOV (SCP) (стр. 180-182). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/SCP.2015.7342085

Vancouver

Nikiforov K, Trofimov V, Egorov N. FIELD EMISSION SPECTROSCOPY OF SILICON CARBIDE: NATURAL MODELLING. в 2015 INTERNATIONAL CONFERENCE "STABILITY AND CONTROL PROCESSES" IN MEMORY OF V.I. ZUBOV (SCP). Institute of Electrical and Electronics Engineers Inc. 2015. стр. 180-182 https://doi.org/10.1109/SCP.2015.7342085

Author

Nikiforov, Konstantin ; Trofimov, Vasiliy ; Egorov, Nikolay. / FIELD EMISSION SPECTROSCOPY OF SILICON CARBIDE: NATURAL MODELLING. 2015 INTERNATIONAL CONFERENCE "STABILITY AND CONTROL PROCESSES" IN MEMORY OF V.I. ZUBOV (SCP). Institute of Electrical and Electronics Engineers Inc., 2015. стр. 180-182

BibTeX

@inproceedings{4a4fbaa635104d5b8de13a8ff9077ea4,
title = "FIELD EMISSION SPECTROSCOPY OF SILICON CARBIDE: NATURAL MODELLING",
author = "Konstantin Nikiforov and Vasiliy Trofimov and Nikolay Egorov",
year = "2015",
doi = "10.1109/SCP.2015.7342085",
language = "English",
isbn = "Russian Science Foundation (Grant No. 15-19-30022)",
pages = "180--182",
booktitle = "2015 INTERNATIONAL CONFERENCE {"}STABILITY AND CONTROL PROCESSES{"} IN MEMORY OF V.I. ZUBOV (SCP)",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
address = "United States",
note = "International Conference on {"}Stability and Control Processes{"} in Memory of V.I. Zubov, SCP 2015 ; Conference date: 05-10-2015 Through 09-10-2015",
url = "http://www.apmath.spbu.ru/scp2015/openconf.php",

}

RIS

TY - GEN

T1 - FIELD EMISSION SPECTROSCOPY OF SILICON CARBIDE: NATURAL MODELLING

AU - Nikiforov, Konstantin

AU - Trofimov, Vasiliy

AU - Egorov, Nikolay

PY - 2015

Y1 - 2015

U2 - 10.1109/SCP.2015.7342085

DO - 10.1109/SCP.2015.7342085

M3 - Conference contribution

SN - Russian Science Foundation (Grant No. 15-19-30022)

SP - 180

EP - 182

BT - 2015 INTERNATIONAL CONFERENCE "STABILITY AND CONTROL PROCESSES" IN MEMORY OF V.I. ZUBOV (SCP)

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - International Conference on "Stability and Control Processes" in Memory of V.I. Zubov, SCP 2015

Y2 - 5 October 2015 through 9 October 2015

ER -

ID: 4765106