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Femtosecond wavelength influence on TiO2:Ag film spectral changes : Comparative study. / Varlamov, Pavel V.; Sergeev, Maksim M.; Zakoldaev, Roman A.; Grigoryev, Evgeniy A.

в: Materials Letters, Том 323, 132605, 15.09.2022.

Результаты исследований: Научные публикации в периодических изданияхстатьяРецензирование

Harvard

Varlamov, PV, Sergeev, MM, Zakoldaev, RA & Grigoryev, EA 2022, 'Femtosecond wavelength influence on TiO2:Ag film spectral changes: Comparative study', Materials Letters, Том. 323, 132605. https://doi.org/10.1016/j.matlet.2022.132605

APA

Varlamov, P. V., Sergeev, M. M., Zakoldaev, R. A., & Grigoryev, E. A. (2022). Femtosecond wavelength influence on TiO2:Ag film spectral changes: Comparative study. Materials Letters, 323, [132605]. https://doi.org/10.1016/j.matlet.2022.132605

Vancouver

Varlamov PV, Sergeev MM, Zakoldaev RA, Grigoryev EA. Femtosecond wavelength influence on TiO2:Ag film spectral changes: Comparative study. Materials Letters. 2022 Сент. 15;323. 132605. https://doi.org/10.1016/j.matlet.2022.132605

Author

Varlamov, Pavel V. ; Sergeev, Maksim M. ; Zakoldaev, Roman A. ; Grigoryev, Evgeniy A. / Femtosecond wavelength influence on TiO2:Ag film spectral changes : Comparative study. в: Materials Letters. 2022 ; Том 323.

BibTeX

@article{d52b99c52d64400b85980ea7da900fff,
title = "Femtosecond wavelength influence on TiO2:Ag film spectral changes: Comparative study",
abstract = "Plasmon resonance tuning was performed by femtosecond laser processing of silver-contained TiO2 sol–gel films. We consider the key role of utilized wavelengths −343 nm and 515 nm, in terms of changing morphology, nanoparticles size and spectrum. The plasmon resonance peak of processed films exhibits an overall decrease (from 2.8 to 2.5 eV) with the increasing of laser fluence in the case of 515 nm. The 343 nm wavelength demonstrates a constant position of the plasmon resonance peak with a higher intensity and narrower half-breadth, which are explained by the difference of photo-thermal mechanisms activated.",
keywords = "Ag, Femtosecond laser, Nanoparticles, Sol-gel, Thin film, TiO",
author = "Varlamov, {Pavel V.} and Sergeev, {Maksim M.} and Zakoldaev, {Roman A.} and Grigoryev, {Evgeniy A.}",
note = "Publisher Copyright: {\textcopyright} 2022 Elsevier B.V.",
year = "2022",
month = sep,
day = "15",
doi = "10.1016/j.matlet.2022.132605",
language = "English",
volume = "323",
journal = "Materials Letters",
issn = "0167-577X",
publisher = "Elsevier",

}

RIS

TY - JOUR

T1 - Femtosecond wavelength influence on TiO2:Ag film spectral changes

T2 - Comparative study

AU - Varlamov, Pavel V.

AU - Sergeev, Maksim M.

AU - Zakoldaev, Roman A.

AU - Grigoryev, Evgeniy A.

N1 - Publisher Copyright: © 2022 Elsevier B.V.

PY - 2022/9/15

Y1 - 2022/9/15

N2 - Plasmon resonance tuning was performed by femtosecond laser processing of silver-contained TiO2 sol–gel films. We consider the key role of utilized wavelengths −343 nm and 515 nm, in terms of changing morphology, nanoparticles size and spectrum. The plasmon resonance peak of processed films exhibits an overall decrease (from 2.8 to 2.5 eV) with the increasing of laser fluence in the case of 515 nm. The 343 nm wavelength demonstrates a constant position of the plasmon resonance peak with a higher intensity and narrower half-breadth, which are explained by the difference of photo-thermal mechanisms activated.

AB - Plasmon resonance tuning was performed by femtosecond laser processing of silver-contained TiO2 sol–gel films. We consider the key role of utilized wavelengths −343 nm and 515 nm, in terms of changing morphology, nanoparticles size and spectrum. The plasmon resonance peak of processed films exhibits an overall decrease (from 2.8 to 2.5 eV) with the increasing of laser fluence in the case of 515 nm. The 343 nm wavelength demonstrates a constant position of the plasmon resonance peak with a higher intensity and narrower half-breadth, which are explained by the difference of photo-thermal mechanisms activated.

KW - Ag

KW - Femtosecond laser

KW - Nanoparticles

KW - Sol-gel

KW - Thin film

KW - TiO

UR - http://www.scopus.com/inward/record.url?scp=85131686680&partnerID=8YFLogxK

U2 - 10.1016/j.matlet.2022.132605

DO - 10.1016/j.matlet.2022.132605

M3 - Article

AN - SCOPUS:85131686680

VL - 323

JO - Materials Letters

JF - Materials Letters

SN - 0167-577X

M1 - 132605

ER -

ID: 99529940