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Electronic States of the Conduction Band of Ultrathin Furan-Phenylene Co-Oligomer Films on the Surfaces of Oxidized Silicon and Layer-by-Layer Grown Zinc Oxide. / Комолов, Алексей Сергеевич; Pronin, I. A.; Лазнева, Элеонора Федоровна; Соболев, Виталий Сергеевич; Дубов, Евгений Андреевич; Комолова, Аделина Алексеевна; Zhizhin, E. V.; Пудиков, Дмитрий Александрович; Pshenichnyuk, S. A.; Becker, Ch. S.; Kazantsev, M. S.; Akbarova, F. Dj.; Sharopov, U. B.

в: Crystallography Reports, Том 69, № 4, 01.08.2024, стр. 556–560.

Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование

Harvard

Комолов, АС, Pronin, IA, Лазнева, ЭФ, Соболев, ВС, Дубов, ЕА, Комолова, АА, Zhizhin, EV, Пудиков, ДА, Pshenichnyuk, SA, Becker, CS, Kazantsev, MS, Akbarova, FD & Sharopov, UB 2024, 'Electronic States of the Conduction Band of Ultrathin Furan-Phenylene Co-Oligomer Films on the Surfaces of Oxidized Silicon and Layer-by-Layer Grown Zinc Oxide', Crystallography Reports, Том. 69, № 4, стр. 556–560. https://doi.org/10.1134/s1063774524601266

APA

Комолов, А. С., Pronin, I. A., Лазнева, Э. Ф., Соболев, В. С., Дубов, Е. А., Комолова, А. А., Zhizhin, E. V., Пудиков, Д. А., Pshenichnyuk, S. A., Becker, C. S., Kazantsev, M. S., Akbarova, F. D., & Sharopov, U. B. (2024). Electronic States of the Conduction Band of Ultrathin Furan-Phenylene Co-Oligomer Films on the Surfaces of Oxidized Silicon and Layer-by-Layer Grown Zinc Oxide. Crystallography Reports, 69(4), 556–560. https://doi.org/10.1134/s1063774524601266

Vancouver

Комолов АС, Pronin IA, Лазнева ЭФ, Соболев ВС, Дубов ЕА, Комолова АА и пр. Electronic States of the Conduction Band of Ultrathin Furan-Phenylene Co-Oligomer Films on the Surfaces of Oxidized Silicon and Layer-by-Layer Grown Zinc Oxide. Crystallography Reports. 2024 Авг. 1;69(4):556–560. https://doi.org/10.1134/s1063774524601266

Author

Комолов, Алексей Сергеевич ; Pronin, I. A. ; Лазнева, Элеонора Федоровна ; Соболев, Виталий Сергеевич ; Дубов, Евгений Андреевич ; Комолова, Аделина Алексеевна ; Zhizhin, E. V. ; Пудиков, Дмитрий Александрович ; Pshenichnyuk, S. A. ; Becker, Ch. S. ; Kazantsev, M. S. ; Akbarova, F. Dj. ; Sharopov, U. B. / Electronic States of the Conduction Band of Ultrathin Furan-Phenylene Co-Oligomer Films on the Surfaces of Oxidized Silicon and Layer-by-Layer Grown Zinc Oxide. в: Crystallography Reports. 2024 ; Том 69, № 4. стр. 556–560.

BibTeX

@article{be6b4a926e604b36af061eb5e958d02d,
title = "Electronic States of the Conduction Band of Ultrathin Furan-Phenylene Co-Oligomer Films on the Surfaces of Oxidized Silicon and Layer-by-Layer Grown Zinc Oxide",
abstract = "The results of studying the electronic states of the conduction band of ultrathin films of furan-phenylene co-oligomer 1,4-bis(5-phenylfuran-2-yl)benzene and the results of analyzing the interfacialpotential barrier upon the formation of these films on the surfaces of (SiO2)n-Si and layer-by-layer depositedZnO are presented. The formation of a (8–10)-nm-thick co-oligomer film was investigated by total currentspectroscopy; the energy range from 5 to 20 eV above EF was analyzed. Furan-phenylene co-oligomer filmson the (SiO2)n-Si surface have a domain structure with a characteristic domain size of ~1 × 1 μm and surfaceroughness within a domain of no more than 1 nm. The films on the ZnO surface have a granular structurewith a grain height of 40–50 nm.",
author = "Комолов, {Алексей Сергеевич} and Pronin, {I. A.} and Лазнева, {Элеонора Федоровна} and Соболев, {Виталий Сергеевич} and Дубов, {Евгений Андреевич} and Комолова, {Аделина Алексеевна} and Zhizhin, {E. V.} and Пудиков, {Дмитрий Александрович} and Pshenichnyuk, {S. A.} and Becker, {Ch. S.} and Kazantsev, {M. S.} and Akbarova, {F. Dj.} and Sharopov, {U. B.}",
year = "2024",
month = aug,
day = "1",
doi = "10.1134/s1063774524601266",
language = "English",
volume = "69",
pages = "556–560",
journal = "Crystallography Reports",
issn = "1063-7745",
publisher = "МАИК {"}Наука/Интерпериодика{"}",
number = "4",

}

RIS

TY - JOUR

T1 - Electronic States of the Conduction Band of Ultrathin Furan-Phenylene Co-Oligomer Films on the Surfaces of Oxidized Silicon and Layer-by-Layer Grown Zinc Oxide

AU - Комолов, Алексей Сергеевич

AU - Pronin, I. A.

AU - Лазнева, Элеонора Федоровна

AU - Соболев, Виталий Сергеевич

AU - Дубов, Евгений Андреевич

AU - Комолова, Аделина Алексеевна

AU - Zhizhin, E. V.

AU - Пудиков, Дмитрий Александрович

AU - Pshenichnyuk, S. A.

AU - Becker, Ch. S.

AU - Kazantsev, M. S.

AU - Akbarova, F. Dj.

AU - Sharopov, U. B.

PY - 2024/8/1

Y1 - 2024/8/1

N2 - The results of studying the electronic states of the conduction band of ultrathin films of furan-phenylene co-oligomer 1,4-bis(5-phenylfuran-2-yl)benzene and the results of analyzing the interfacialpotential barrier upon the formation of these films on the surfaces of (SiO2)n-Si and layer-by-layer depositedZnO are presented. The formation of a (8–10)-nm-thick co-oligomer film was investigated by total currentspectroscopy; the energy range from 5 to 20 eV above EF was analyzed. Furan-phenylene co-oligomer filmson the (SiO2)n-Si surface have a domain structure with a characteristic domain size of ~1 × 1 μm and surfaceroughness within a domain of no more than 1 nm. The films on the ZnO surface have a granular structurewith a grain height of 40–50 nm.

AB - The results of studying the electronic states of the conduction band of ultrathin films of furan-phenylene co-oligomer 1,4-bis(5-phenylfuran-2-yl)benzene and the results of analyzing the interfacialpotential barrier upon the formation of these films on the surfaces of (SiO2)n-Si and layer-by-layer depositedZnO are presented. The formation of a (8–10)-nm-thick co-oligomer film was investigated by total currentspectroscopy; the energy range from 5 to 20 eV above EF was analyzed. Furan-phenylene co-oligomer filmson the (SiO2)n-Si surface have a domain structure with a characteristic domain size of ~1 × 1 μm and surfaceroughness within a domain of no more than 1 nm. The films on the ZnO surface have a granular structurewith a grain height of 40–50 nm.

UR - https://www.mendeley.com/catalogue/3d57d19e-670a-324d-89b5-a23ec1883227/

U2 - 10.1134/s1063774524601266

DO - 10.1134/s1063774524601266

M3 - Article

VL - 69

SP - 556

EP - 560

JO - Crystallography Reports

JF - Crystallography Reports

SN - 1063-7745

IS - 4

ER -

ID: 122639244