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Electron microscopy study of the microstructure of Ni–W substrate surface. / Ovcharov, A. V.; Karateev, I. A.; Mikhutkin, A. A.; Orekhov, A. S.; Presniakov, M. Yu; Chernykh, I. A.; Zanaveskin, M. L.; Kovalchuk, M. V.; Vasiliev, A. L.

в: Crystallography Reports, Том 61, № 6, 01.11.2016, стр. 1002-1007.

Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование

Harvard

Ovcharov, AV, Karateev, IA, Mikhutkin, AA, Orekhov, AS, Presniakov, MY, Chernykh, IA, Zanaveskin, ML, Kovalchuk, MV & Vasiliev, AL 2016, 'Electron microscopy study of the microstructure of Ni–W substrate surface', Crystallography Reports, Том. 61, № 6, стр. 1002-1007. https://doi.org/10.1134/S1063774516060109

APA

Ovcharov, A. V., Karateev, I. A., Mikhutkin, A. A., Orekhov, A. S., Presniakov, M. Y., Chernykh, I. A., Zanaveskin, M. L., Kovalchuk, M. V., & Vasiliev, A. L. (2016). Electron microscopy study of the microstructure of Ni–W substrate surface. Crystallography Reports, 61(6), 1002-1007. https://doi.org/10.1134/S1063774516060109

Vancouver

Ovcharov AV, Karateev IA, Mikhutkin AA, Orekhov AS, Presniakov MY, Chernykh IA и пр. Electron microscopy study of the microstructure of Ni–W substrate surface. Crystallography Reports. 2016 Нояб. 1;61(6):1002-1007. https://doi.org/10.1134/S1063774516060109

Author

Ovcharov, A. V. ; Karateev, I. A. ; Mikhutkin, A. A. ; Orekhov, A. S. ; Presniakov, M. Yu ; Chernykh, I. A. ; Zanaveskin, M. L. ; Kovalchuk, M. V. ; Vasiliev, A. L. / Electron microscopy study of the microstructure of Ni–W substrate surface. в: Crystallography Reports. 2016 ; Том 61, № 6. стр. 1002-1007.

BibTeX

@article{5987ed4e078845e89165d5b311563f6c,
title = "Electron microscopy study of the microstructure of Ni–W substrate surface",
abstract = "The surface microstructure of Ni–W alloy tapes, which are used as substrates to form films of high-temperature superconductors and photovoltaic devices, has been studied. Several samples of a Ni95W5 tape (Evico) annealed under different conditions were analyzed using scanning electron microscopy, energy-dispersive X-ray microanalysis, electron diffraction, and electron energy-loss spectroscopy. NiWO4 precipitates are found on the surface of annealed samples. The growth of precipitates at a temperature of 950°С is accompanied by the formation of pores on the surface or under an oxide film. Depressions with a wedge-shaped profile are found at the grain boundaries. Annealing in a reducing atmosphere using a specially prepared chamber allows one to form a surface free of nickel tungstate precipitates.",
author = "Ovcharov, {A. V.} and Karateev, {I. A.} and Mikhutkin, {A. A.} and Orekhov, {A. S.} and Presniakov, {M. Yu} and Chernykh, {I. A.} and Zanaveskin, {M. L.} and Kovalchuk, {M. V.} and Vasiliev, {A. L.}",
note = "Publisher Copyright: {\textcopyright} 2016, Pleiades Publishing, Inc.",
year = "2016",
month = nov,
day = "1",
doi = "10.1134/S1063774516060109",
language = "English",
volume = "61",
pages = "1002--1007",
journal = "Crystallography Reports",
issn = "1063-7745",
publisher = "МАИК {"}Наука/Интерпериодика{"}",
number = "6",

}

RIS

TY - JOUR

T1 - Electron microscopy study of the microstructure of Ni–W substrate surface

AU - Ovcharov, A. V.

AU - Karateev, I. A.

AU - Mikhutkin, A. A.

AU - Orekhov, A. S.

AU - Presniakov, M. Yu

AU - Chernykh, I. A.

AU - Zanaveskin, M. L.

AU - Kovalchuk, M. V.

AU - Vasiliev, A. L.

N1 - Publisher Copyright: © 2016, Pleiades Publishing, Inc.

PY - 2016/11/1

Y1 - 2016/11/1

N2 - The surface microstructure of Ni–W alloy tapes, which are used as substrates to form films of high-temperature superconductors and photovoltaic devices, has been studied. Several samples of a Ni95W5 tape (Evico) annealed under different conditions were analyzed using scanning electron microscopy, energy-dispersive X-ray microanalysis, electron diffraction, and electron energy-loss spectroscopy. NiWO4 precipitates are found on the surface of annealed samples. The growth of precipitates at a temperature of 950°С is accompanied by the formation of pores on the surface or under an oxide film. Depressions with a wedge-shaped profile are found at the grain boundaries. Annealing in a reducing atmosphere using a specially prepared chamber allows one to form a surface free of nickel tungstate precipitates.

AB - The surface microstructure of Ni–W alloy tapes, which are used as substrates to form films of high-temperature superconductors and photovoltaic devices, has been studied. Several samples of a Ni95W5 tape (Evico) annealed under different conditions were analyzed using scanning electron microscopy, energy-dispersive X-ray microanalysis, electron diffraction, and electron energy-loss spectroscopy. NiWO4 precipitates are found on the surface of annealed samples. The growth of precipitates at a temperature of 950°С is accompanied by the formation of pores on the surface or under an oxide film. Depressions with a wedge-shaped profile are found at the grain boundaries. Annealing in a reducing atmosphere using a specially prepared chamber allows one to form a surface free of nickel tungstate precipitates.

UR - http://www.scopus.com/inward/record.url?scp=84995395307&partnerID=8YFLogxK

U2 - 10.1134/S1063774516060109

DO - 10.1134/S1063774516060109

M3 - Article

AN - SCOPUS:84995395307

VL - 61

SP - 1002

EP - 1007

JO - Crystallography Reports

JF - Crystallography Reports

SN - 1063-7745

IS - 6

ER -

ID: 88202502