Correlations between frequencies of the Raman-active A(TO) and E(LO) phonons and the layer thickness ratio in the AlN/GaN superlattices are determined. Theoretical frequency-structure relations are derived by using the dielectric continuum model. It is found that the elastic strains which inevitably arising in the layers upon SL growth affect frequencies of the most Raman-intense polar modes insignificantly. The obtained frequency-structure relations agree well with available experimental data. These results confirm efficiency of the Raman spectroscopy for a fast nondestructive structure characterization.