Many well-known goodness-of-fit and symmetry tests are based on U- and V-statistics. The analysis of their large deviations provides new expressions for their local Bahadur efficiency and general conditions for local optimality. This leads to new characterizations of distributions for some known statistics and common alternatives.

Язык оригиналаанглийский
Страницы (с-по)185-200
Число страниц16
ЖурналMetron
Том62
Номер выпуска2
СостояниеОпубликовано - 1 дек 2004

    Предметные области Scopus

  • Теория вероятности и статистика

ID: 47771728