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Effect of the interface structure in multilayered systems on x-ray specular scattering spectra. / Romanov, V. P.; Uzdin, S. V.; Uzdin, V. M.; Ul'yanov, S. V.

в: Physics of the Solid State, Том 48, № 1, 01.01.2006, стр. 155-163.

Результаты исследований: Научные публикации в периодических изданияхстатьяРецензирование

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Romanov, V. P. ; Uzdin, S. V. ; Uzdin, V. M. ; Ul'yanov, S. V. / Effect of the interface structure in multilayered systems on x-ray specular scattering spectra. в: Physics of the Solid State. 2006 ; Том 48, № 1. стр. 155-163.

BibTeX

@article{314b73e5fcdc408392ffc6db535d63d7,
title = "Effect of the interface structure in multilayered systems on x-ray specular scattering spectra",
abstract = "The effect of the spatial structure of an interface in multilayer metallic films on the spectrum of x-ray specular scattering is studied. Two types of interface structural defects are considered. One type is steps resulting in a variable layer thickness, and the other is the mixing of unlike metal atoms during epitaxial growth. These defects are shown to have different effects on the specular-scattering spectra. The mixing significantly decreases the Bragg-peak height, especially the height of higher order peaks. The interface roughness results in broadening of the Bragg peaks and in the disappearance of intermediate peaks between them.",
author = "Romanov, {V. P.} and Uzdin, {S. V.} and Uzdin, {V. M.} and Ul'yanov, {S. V.}",
year = "2006",
month = jan,
day = "1",
doi = "10.1134/S106378340601029X",
language = "English",
volume = "48",
pages = "155--163",
journal = "Physics of the Solid State",
issn = "1063-7834",
publisher = "МАИК {"}Наука/Интерпериодика{"}",
number = "1",

}

RIS

TY - JOUR

T1 - Effect of the interface structure in multilayered systems on x-ray specular scattering spectra

AU - Romanov, V. P.

AU - Uzdin, S. V.

AU - Uzdin, V. M.

AU - Ul'yanov, S. V.

PY - 2006/1/1

Y1 - 2006/1/1

N2 - The effect of the spatial structure of an interface in multilayer metallic films on the spectrum of x-ray specular scattering is studied. Two types of interface structural defects are considered. One type is steps resulting in a variable layer thickness, and the other is the mixing of unlike metal atoms during epitaxial growth. These defects are shown to have different effects on the specular-scattering spectra. The mixing significantly decreases the Bragg-peak height, especially the height of higher order peaks. The interface roughness results in broadening of the Bragg peaks and in the disappearance of intermediate peaks between them.

AB - The effect of the spatial structure of an interface in multilayer metallic films on the spectrum of x-ray specular scattering is studied. Two types of interface structural defects are considered. One type is steps resulting in a variable layer thickness, and the other is the mixing of unlike metal atoms during epitaxial growth. These defects are shown to have different effects on the specular-scattering spectra. The mixing significantly decreases the Bragg-peak height, especially the height of higher order peaks. The interface roughness results in broadening of the Bragg peaks and in the disappearance of intermediate peaks between them.

UR - http://www.scopus.com/inward/record.url?scp=33144455827&partnerID=8YFLogxK

U2 - 10.1134/S106378340601029X

DO - 10.1134/S106378340601029X

M3 - Article

AN - SCOPUS:33144455827

VL - 48

SP - 155

EP - 163

JO - Physics of the Solid State

JF - Physics of the Solid State

SN - 1063-7834

IS - 1

ER -

ID: 40339299