Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
Double-Crystal Rocking Curve Simulation Using 2D Spectral Angular Diagrams of X-Ray Radiation. / Atknin, I. I.; Marchenkov, N. V.; Chukhovskii, F. N.; Blagov, A. E.; Kovalchuk, M. V.
в: Crystallography Reports, Том 63, № 4, 01.07.2018, стр. 521-530.Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
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TY - JOUR
T1 - Double-Crystal Rocking Curve Simulation Using 2D Spectral Angular Diagrams of X-Ray Radiation
AU - Atknin, I. I.
AU - Marchenkov, N. V.
AU - Chukhovskii, F. N.
AU - Blagov, A. E.
AU - Kovalchuk, M. V.
N1 - Publisher Copyright: © 2018, Pleiades Publishing, Inc.
PY - 2018/7/1
Y1 - 2018/7/1
N2 - A new approach to numerical simulation of double-crystal rocking curves is proposed. This approach is based on the use of experimental spectral angular diagrams of X-ray intensity distribution. Special calculation algorithms, which take into account the instrumental function of X-ray diffractometer and possible effects of dispersion and Bragg reflection asymmetry, have been developed and applied. A specific feature of the proposed approach is the possibility of visualizing the 2D spectral angular diagram of X-ray beam after its interaction with each element of the scheme. The approach makes it possible to perform calculations for a wide range of radiation sources (from an X-ray tube with any anode to a synchrotron radiation source) and X-ray optical elements (slits and monochromators). A comparison of simulation results and experimental data for a Si(110) crystal sample has confirmed adequacy of the proposed approach and its applicability for simulating diffraction patterns recorded in real experiments.
AB - A new approach to numerical simulation of double-crystal rocking curves is proposed. This approach is based on the use of experimental spectral angular diagrams of X-ray intensity distribution. Special calculation algorithms, which take into account the instrumental function of X-ray diffractometer and possible effects of dispersion and Bragg reflection asymmetry, have been developed and applied. A specific feature of the proposed approach is the possibility of visualizing the 2D spectral angular diagram of X-ray beam after its interaction with each element of the scheme. The approach makes it possible to perform calculations for a wide range of radiation sources (from an X-ray tube with any anode to a synchrotron radiation source) and X-ray optical elements (slits and monochromators). A comparison of simulation results and experimental data for a Si(110) crystal sample has confirmed adequacy of the proposed approach and its applicability for simulating diffraction patterns recorded in real experiments.
UR - http://www.scopus.com/inward/record.url?scp=85051077831&partnerID=8YFLogxK
U2 - 10.1134/S1063774518040041
DO - 10.1134/S1063774518040041
M3 - Article
AN - SCOPUS:85051077831
VL - 63
SP - 521
EP - 530
JO - Crystallography Reports
JF - Crystallography Reports
SN - 1063-7745
IS - 4
ER -
ID: 88200189