Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
Double stacking faults in convectively assembled crystals of colloidal spheres. / Hilhorst, Jan; Abramova, Vera V.; Sinitskii, Alexander; Sapoletova, Nina A.; Napolskii, Kirill S.; Eliseev, Andrey A.; Byelov, Dmytro V.; Grigoryeva, Natali A.; Vasilieva, Alexandra V.; Bouwman, Wim G.; Kvashnina, Kristina; Snigirev, Anatoly; Grigoriev, Sergey V.; Petukhov, Andrei V.
в: Langmuir, Том 25, № 17, 01.09.2009, стр. 10408-10412.Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
}
TY - JOUR
T1 - Double stacking faults in convectively assembled crystals of colloidal spheres
AU - Hilhorst, Jan
AU - Abramova, Vera V.
AU - Sinitskii, Alexander
AU - Sapoletova, Nina A.
AU - Napolskii, Kirill S.
AU - Eliseev, Andrey A.
AU - Byelov, Dmytro V.
AU - Grigoryeva, Natali A.
AU - Vasilieva, Alexandra V.
AU - Bouwman, Wim G.
AU - Kvashnina, Kristina
AU - Snigirev, Anatoly
AU - Grigoriev, Sergey V.
AU - Petukhov, Andrei V.
PY - 2009/9/1
Y1 - 2009/9/1
N2 - Using microradian X-ray diffraction, we investigated the crystal structure of convectively assembled colloidal photonic crystals over macroscopic (0.5 mm) distances. Through adaptation of Wilson's theory for X-ray diffraction, we show that certain types of line defects that are often observed in scanning electron microscopy images of the surface of these crystals are actually planar defects at 70.5° angles with the substrate. The defects consist of two parallel hexagonal close-packed planes in otherwise face-centered cubic crystals. Our measurements indicate that these stacking faults cause at least 10% of stacking disorder, which has to be reduced to fabricate high-quality colloidal photonic crystals.
AB - Using microradian X-ray diffraction, we investigated the crystal structure of convectively assembled colloidal photonic crystals over macroscopic (0.5 mm) distances. Through adaptation of Wilson's theory for X-ray diffraction, we show that certain types of line defects that are often observed in scanning electron microscopy images of the surface of these crystals are actually planar defects at 70.5° angles with the substrate. The defects consist of two parallel hexagonal close-packed planes in otherwise face-centered cubic crystals. Our measurements indicate that these stacking faults cause at least 10% of stacking disorder, which has to be reduced to fabricate high-quality colloidal photonic crystals.
UR - http://www.scopus.com/inward/record.url?scp=69949145094&partnerID=8YFLogxK
U2 - 10.1021/la900983v
DO - 10.1021/la900983v
M3 - Article
AN - SCOPUS:69949145094
VL - 25
SP - 10408
EP - 10412
JO - Langmuir
JF - Langmuir
SN - 0743-7463
IS - 17
ER -
ID: 28230890