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Distortions in IR spectra related to the registration conditions: I. The influence of the reflection from interfaces. / Murzin, P. D.; Novikov, R. G.; Tsyganenko, A. A.
в: Optics and Spectroscopy (English translation of Optika i Spektroskopiya), Том 121, № 1, 2016, стр. 10-17.Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
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TY - JOUR
T1 - Distortions in IR spectra related to the registration conditions: I. The influence of the reflection from interfaces
AU - Murzin, P. D.
AU - Novikov, R. G.
AU - Tsyganenko, A. A.
N1 - Murzin, P.D., Novikov, R.G. & Tsyganenko, A.A. Distortions in IR spectra related to the registration conditions: I. The influence of the reflection from interfaces. Opt. Spectrosc. 121, 10–17 (2016). https://doi.org/10.1134/S0030400X1607016X
PY - 2016
Y1 - 2016
N2 - We show that the contour of an absorption band of a thin layer of a liquid or a film of a solid compound deposited onto a substrate can be strongly distorted as a result of the reflection from the specimen surface or the interface with the substrate if the refractive index of the compound under study changes sharply in the range of the absorption band. We consider the theory of this phenomenon and ways of taking it into account in studies of the absorption spectra of films, liquids, and adsorbed molecules.
AB - We show that the contour of an absorption band of a thin layer of a liquid or a film of a solid compound deposited onto a substrate can be strongly distorted as a result of the reflection from the specimen surface or the interface with the substrate if the refractive index of the compound under study changes sharply in the range of the absorption band. We consider the theory of this phenomenon and ways of taking it into account in studies of the absorption spectra of films, liquids, and adsorbed molecules.
U2 - 10.1134/S0030400X1607016X
DO - 10.1134/S0030400X1607016X
M3 - Article
VL - 121
SP - 10
EP - 17
JO - OPTICS AND SPECTROSCOPY
JF - OPTICS AND SPECTROSCOPY
SN - 0030-400X
IS - 1
ER -
ID: 7598821