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Dimensional quantization and the resonance concept of the Low-Threshold field emission. / Fursey, G.; Konorov, P.; Pavlov, B.; Yafyasov, A.

в: ELECTRONICS, Том 4, № 4, 2015, стр. 1101-1108.

Результаты исследований: Научные публикации в периодических изданияхстатьяРецензирование

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Fursey, G. ; Konorov, P. ; Pavlov, B. ; Yafyasov, A. / Dimensional quantization and the resonance concept of the Low-Threshold field emission. в: ELECTRONICS. 2015 ; Том 4, № 4. стр. 1101-1108.

BibTeX

@article{29d473ef3674419e8d096f0850064c2d,
title = "Dimensional quantization and the resonance concept of the Low-Threshold field emission",
abstract = "{\textcopyright} 2015 by the authors; licensee MDPI, Basel, Switzerland.We present a brief critical review of modern theoretical interpretations of the low-threshold field emission phenomenon for metallic electrodes covered with carbon structures, taking the latest experiments into consideration, and confirming the continuity of spectrum of resonance states localized on the interface of the metallic body of the cathode and the carbon cover. Our proposal allowed us to interpret the double maxima of the emitted electron{\textquoteright}s distribution on full energy. The theoretical interpretation is presented in a previous paper which describes the (1 + 1) model of a periodic 1D continuous interface. The overlapping of the double maxima may be interpreted taking into account a 2D superlattice periodic structure of the metal-vacuum interface, while the energy of emitted electrons lies on the overlapping spectral gaps of the interface 2D periodic lattice.",
author = "G. Fursey and P. Konorov and B. Pavlov and A. Yafyasov",
year = "2015",
doi = "10.3390/electronics4041101",
language = "English",
volume = "4",
pages = "1101--1108",
journal = "Electronics (Switzerland)",
issn = "2079-9292",
publisher = "MDPI AG",
number = "4",

}

RIS

TY - JOUR

T1 - Dimensional quantization and the resonance concept of the Low-Threshold field emission

AU - Fursey, G.

AU - Konorov, P.

AU - Pavlov, B.

AU - Yafyasov, A.

PY - 2015

Y1 - 2015

N2 - © 2015 by the authors; licensee MDPI, Basel, Switzerland.We present a brief critical review of modern theoretical interpretations of the low-threshold field emission phenomenon for metallic electrodes covered with carbon structures, taking the latest experiments into consideration, and confirming the continuity of spectrum of resonance states localized on the interface of the metallic body of the cathode and the carbon cover. Our proposal allowed us to interpret the double maxima of the emitted electron’s distribution on full energy. The theoretical interpretation is presented in a previous paper which describes the (1 + 1) model of a periodic 1D continuous interface. The overlapping of the double maxima may be interpreted taking into account a 2D superlattice periodic structure of the metal-vacuum interface, while the energy of emitted electrons lies on the overlapping spectral gaps of the interface 2D periodic lattice.

AB - © 2015 by the authors; licensee MDPI, Basel, Switzerland.We present a brief critical review of modern theoretical interpretations of the low-threshold field emission phenomenon for metallic electrodes covered with carbon structures, taking the latest experiments into consideration, and confirming the continuity of spectrum of resonance states localized on the interface of the metallic body of the cathode and the carbon cover. Our proposal allowed us to interpret the double maxima of the emitted electron’s distribution on full energy. The theoretical interpretation is presented in a previous paper which describes the (1 + 1) model of a periodic 1D continuous interface. The overlapping of the double maxima may be interpreted taking into account a 2D superlattice periodic structure of the metal-vacuum interface, while the energy of emitted electrons lies on the overlapping spectral gaps of the interface 2D periodic lattice.

U2 - 10.3390/electronics4041101

DO - 10.3390/electronics4041101

M3 - Article

VL - 4

SP - 1101

EP - 1108

JO - Electronics (Switzerland)

JF - Electronics (Switzerland)

SN - 2079-9292

IS - 4

ER -

ID: 4004671