Результаты исследований: Научные публикации в периодических изданиях › статья в журнале по материалам конференции › Рецензирование
Diffraction efficiency and damage threshold of the holographic grating with a multilayer dielectric coating. / Sall, E. G.; Andreev, A. A.; Vinokurova, V. D.; Gerke, R. R.; Yashin, V. E.
в: Proceedings of SPIE - The International Society for Optical Engineering, Том 5482, 2004, стр. 112-118.Результаты исследований: Научные публикации в периодических изданиях › статья в журнале по материалам конференции › Рецензирование
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TY - JOUR
T1 - Diffraction efficiency and damage threshold of the holographic grating with a multilayer dielectric coating
AU - Sall, E. G.
AU - Andreev, A. A.
AU - Vinokurova, V. D.
AU - Gerke, R. R.
AU - Yashin, V. E.
PY - 2004
Y1 - 2004
N2 - In the process of creation of multi-layered coating through evaporation of the dielectric occurs considerable smoothing of an initial grating relief. The smoothing results in reduce of the diffraction efficiency and damage threshold of the grating at the working wavelength. The value of the smoothing is measured. Calculation of the structure parameters of the grating by real smoothing is made to improve the diffraction efficiency and damage threshold.
AB - In the process of creation of multi-layered coating through evaporation of the dielectric occurs considerable smoothing of an initial grating relief. The smoothing results in reduce of the diffraction efficiency and damage threshold of the grating at the working wavelength. The value of the smoothing is measured. Calculation of the structure parameters of the grating by real smoothing is made to improve the diffraction efficiency and damage threshold.
KW - Damage threshold
KW - Diffraction efficiency
KW - Diffraction grating
KW - Multilayer dielectric coating
UR - http://www.scopus.com/inward/record.url?scp=3543069277&partnerID=8YFLogxK
U2 - 10.1117/12.558818
DO - 10.1117/12.558818
M3 - Conference article
AN - SCOPUS:3543069277
VL - 5482
SP - 112
EP - 118
JO - Proceedings of SPIE - The International Society for Optical Engineering
JF - Proceedings of SPIE - The International Society for Optical Engineering
SN - 0277-786X
T2 - Laser Optics 2003: Superintense Light Fields and Ultrafast Processes
Y2 - 30 June 2003 through 4 July 2003
ER -
ID: 86380777