Defect recognition and impurity detection techniques in crystalline silicon for solar cells

Standard

Defect recognition and impurity detection techniques in crystalline silicon for solar cells. / Istratov, A. A.; Hieslmair, H.; Vyvenko, O. F.; Weber, E. R.; Schindler, R.

в: Solar Energy Materials and Solar Cells, Том 72, № 1-4, 01.04.2002, стр. 441-451.

Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование

Author

Istratov, A. A. ; Hieslmair, H. ; Vyvenko, O. F. ; Weber, E. R. ; Schindler, R. / Defect recognition and impurity detection techniques in crystalline silicon for solar cells. в: Solar Energy Materials and Solar Cells. 2002 ; Том 72, № 1-4. стр. 441-451.

BibTeX

@article{d063c60693f94d6588c45cc8fd1953f8,

title = "Defect recognition and impurity detection techniques in crystalline silicon for solar cells",

abstract = "The efficiency of multicrystalline solar cells is limited by defects and impurities, which include grain boundaries, dislocations, and transition metals. The density of these defects often varies from grain to grain. {"}Bad grains{"} with low minority carrier diffusion length generate low open circuit voltage and shunt the {"}good grains{"} with high minority carrier diffusion length, thus reducing the overall cell efficiency. It was found that it is more likely to find transition metal clusters in {"}bad grains{"} than in {"}good grains{"}, and that gettering is not efficient in improving the areas of low diffusion length. The primary objective of materials research in photovoltaics is identification of these lifetime-limiting defects. In this article we summarize the current state of understanding of lifetime-limiting defects in solar cells, summarize the advantages and limitations of traditional analytical tools and discuss novel emerging techniques, including X-ray fluorescence microprobe, X-ray absorption spectromicroscopy, and X-ray beam-induced current {\textcopyright} 2002 Elsevier Science B.V. All rights reserved.",

keywords = "Defect clusters, DLTS, EBIC, Solar cells, X-ray fluorescence, XBIC",

author = "Istratov, {A. A.} and H. Hieslmair and Vyvenko, {O. F.} and Weber, {E. R.} and R. Schindler",

year = "2002",

month = apr,

day = "1",

doi = "10.1016/S0927-0248(01)00192-1",

language = "English",

volume = "72",

pages = "441--451",

journal = "Solar Energy Materials and Solar Cells",

issn = "0927-0248",

publisher = "Elsevier",

number = "1-4",

}

RIS

TY - JOUR

T1 - Defect recognition and impurity detection techniques in crystalline silicon for solar cells

AU - Istratov, A. A.

AU - Hieslmair, H.

AU - Vyvenko, O. F.

AU - Weber, E. R.

AU - Schindler, R.

PY - 2002/4/1

Y1 - 2002/4/1

N2 - The efficiency of multicrystalline solar cells is limited by defects and impurities, which include grain boundaries, dislocations, and transition metals. The density of these defects often varies from grain to grain. "Bad grains" with low minority carrier diffusion length generate low open circuit voltage and shunt the "good grains" with high minority carrier diffusion length, thus reducing the overall cell efficiency. It was found that it is more likely to find transition metal clusters in "bad grains" than in "good grains", and that gettering is not efficient in improving the areas of low diffusion length. The primary objective of materials research in photovoltaics is identification of these lifetime-limiting defects. In this article we summarize the current state of understanding of lifetime-limiting defects in solar cells, summarize the advantages and limitations of traditional analytical tools and discuss novel emerging techniques, including X-ray fluorescence microprobe, X-ray absorption spectromicroscopy, and X-ray beam-induced current © 2002 Elsevier Science B.V. All rights reserved.

AB - The efficiency of multicrystalline solar cells is limited by defects and impurities, which include grain boundaries, dislocations, and transition metals. The density of these defects often varies from grain to grain. "Bad grains" with low minority carrier diffusion length generate low open circuit voltage and shunt the "good grains" with high minority carrier diffusion length, thus reducing the overall cell efficiency. It was found that it is more likely to find transition metal clusters in "bad grains" than in "good grains", and that gettering is not efficient in improving the areas of low diffusion length. The primary objective of materials research in photovoltaics is identification of these lifetime-limiting defects. In this article we summarize the current state of understanding of lifetime-limiting defects in solar cells, summarize the advantages and limitations of traditional analytical tools and discuss novel emerging techniques, including X-ray fluorescence microprobe, X-ray absorption spectromicroscopy, and X-ray beam-induced current © 2002 Elsevier Science B.V. All rights reserved.

KW - Defect clusters

KW - DLTS

KW - EBIC

KW - Solar cells

KW - X-ray fluorescence

KW - XBIC

UR - http://www.scopus.com/inward/record.url?scp=0036533370&partnerID=8YFLogxK

U2 - 10.1016/S0927-0248(01)00192-1

DO - 10.1016/S0927-0248(01)00192-1

M3 - Article

AN - SCOPUS:0036533370

VL - 72

SP - 441

EP - 451

JO - Solar Energy Materials and Solar Cells

JF - Solar Energy Materials and Solar Cells

SN - 0927-0248

IS - 1-4

ER -

ID: 87815406