Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
Decoding the structure of interfaces and impurities in 2D materials by photoelectron holography. / Usachov, Dmitry Yu. ; Tarasov, Artem V. ; Matsui, Fumihiko; Muntwiler, Matthias; Bokai, Kirill A. ; Shevelev, Viktor O. ; Vilkov, Oleg Yu. ; Kuznetsov, Mikhail V.; Yashina, Lada V.; Laubschat, Clemens; Cossaro, Albano; Floreano, Luca; Verdini, Alberto; Vyalikh, Denis V. .
в: 2D Materials, Том 6, № 4, 045046, 2019.Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
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TY - JOUR
T1 - Decoding the structure of interfaces and impurities in 2D materials by photoelectron holography
AU - Usachov, Dmitry Yu.
AU - Tarasov, Artem V.
AU - Matsui, Fumihiko
AU - Muntwiler, Matthias
AU - Bokai, Kirill A.
AU - Shevelev, Viktor O.
AU - Vilkov, Oleg Yu.
AU - Kuznetsov, Mikhail V.
AU - Yashina, Lada V.
AU - Laubschat, Clemens
AU - Cossaro, Albano
AU - Floreano, Luca
AU - Verdini, Alberto
AU - Vyalikh, Denis V.
PY - 2019
Y1 - 2019
N2 - The properties of atomically thin materials essentially depend on their structures, including impurities, defects and interfaces with underlying substrates. Thus, the detailed structural information is relevant for creation of 2D materials with desired properties. Here, we explore the capabilities of photoelectron diffraction and holography for structural analysis of atomically thin layers using as examples such systems as h-BN, graphene, and modified graphene with boron impurities. We show that for planar 2D crystals with commensurate interface to the substrate, it is possible to visualize the interface and impurities with high spatial resolution, and to distinguish possible non-equivalent structural units. Our approach applied to B-doped graphene on Ni(1 1 1) and Co(0 0 0 1) surfaces has allowed to reveal asymmetry of boron concentrations in the two carbon sublattices and established its dependence on the applied synthesis procedure and chosen substrate. The obtained results suggest that such approach can be widely applied for studies of various 2D systems, where the structures of interfaces and defects are of remarkable importance.
AB - The properties of atomically thin materials essentially depend on their structures, including impurities, defects and interfaces with underlying substrates. Thus, the detailed structural information is relevant for creation of 2D materials with desired properties. Here, we explore the capabilities of photoelectron diffraction and holography for structural analysis of atomically thin layers using as examples such systems as h-BN, graphene, and modified graphene with boron impurities. We show that for planar 2D crystals with commensurate interface to the substrate, it is possible to visualize the interface and impurities with high spatial resolution, and to distinguish possible non-equivalent structural units. Our approach applied to B-doped graphene on Ni(1 1 1) and Co(0 0 0 1) surfaces has allowed to reveal asymmetry of boron concentrations in the two carbon sublattices and established its dependence on the applied synthesis procedure and chosen substrate. The obtained results suggest that such approach can be widely applied for studies of various 2D systems, where the structures of interfaces and defects are of remarkable importance.
KW - AUGER-ELECTRON
KW - DIFFRACTION
KW - ELECTRON HOLOGRAPHY
KW - HEXAGONAL BORON-NITRIDE
KW - IMAGE RECONSTRUCTION
KW - LOCAL ATOMIC-STRUCTURE
KW - MONOLAYER GRAPHITE
KW - MULTIPLE-SCATTERING
KW - NI(111)
KW - SURFACE
KW - doping
KW - graphene
KW - hexagonal boron nitride
KW - photoelectron diffraction
KW - photoelectron holography
KW - structure
U2 - https://doi.org/10.1088/2053-1583/ab3ea8
DO - https://doi.org/10.1088/2053-1583/ab3ea8
M3 - Article
VL - 6
JO - 2D Materials
JF - 2D Materials
SN - 2053-1583
IS - 4
M1 - 045046
ER -
ID: 49271850