Результаты исследований: Публикации в книгах, отчётах, сборниках, трудах конференций › статья в сборнике материалов конференции › научная
Circular arc crack near an interface. / Malkova, Yu. V. .
10th International Vacuum Electron Sources Conference, IVESC 2014. Institute of Electrical and Electronics Engineers Inc., 2014. стр. 1-2.Результаты исследований: Публикации в книгах, отчётах, сборниках, трудах конференций › статья в сборнике материалов конференции › научная
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TY - GEN
T1 - Circular arc crack near an interface
AU - Malkova, Yu. V.
PY - 2014
Y1 - 2014
N2 - The analytical solution of a plane problem for a bimaterial plane with a crack in the shape of the circular arc located near an interface is obtained. On the crack edges external load is applied. At infinity stresses and angles of rotation are given. Method of complex potentials of Kolosov - Muskhelishvili together with a superposition method is used for solving the problem. The boundary problem is reduced to a Fredholm equation of the second kind, which solution is constructed in a polynomial form. Formulas for stress intensity factors are obtained.
AB - The analytical solution of a plane problem for a bimaterial plane with a crack in the shape of the circular arc located near an interface is obtained. On the crack edges external load is applied. At infinity stresses and angles of rotation are given. Method of complex potentials of Kolosov - Muskhelishvili together with a superposition method is used for solving the problem. The boundary problem is reduced to a Fredholm equation of the second kind, which solution is constructed in a polynomial form. Formulas for stress intensity factors are obtained.
UR - https://ieeexplore.ieee.org/xpl/conhome/6881323/proceeding?isnumber=6891922&sortType=vol-only-seq&searchWithin=Circular%20arc%20crack%20near%20an%20interface
M3 - Conference contribution
SN - 9781479957705
SP - 1
EP - 2
BT - 10th International Vacuum Electron Sources Conference, IVESC 2014
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - Tenth International Vacuum Electron Sources Conference
Y2 - 30 June 2014 through 4 July 2014
ER -
ID: 36129083