Casimir interaction of two SiO₂ glass half spaces being substrates for Chern-Simons boundary layers is studied. The separation between two half spaces at which the Casimir energy minimum occurs is strongly increased for dielectric SiO₂ glass substrates in comparison with previously considered metal Au and semiconductor Si substrates. Strong reduction in the Casimir force due to presence of Chern-Simons layers is found for SiO₂ glass substrate. Influence of modification of the infrared absorption on the Casimir force is studied.