Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
Characteristics of a silicon carbide field emission array under pre-breakdown conditions. / Морозов, Виктор Александрович; Егоров, Николай Васильевич; Трофимов, Василий Валерьевич; Никифоров, Константин Аркадьевич; Закиров, Ильдар Илюсович; Кац, Виктор Михайлович; Ильин, Владимир; Иванов, Алексей.
в: Technical Physics, Том 68, № 4, 2023, стр. 531-537.Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
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TY - JOUR
T1 - Characteristics of a silicon carbide field emission array under pre-breakdown conditions
AU - Морозов, Виктор Александрович
AU - Егоров, Николай Васильевич
AU - Трофимов, Василий Валерьевич
AU - Никифоров, Константин Аркадьевич
AU - Закиров, Ильдар Илюсович
AU - Кац, Виктор Михайлович
AU - Ильин, Владимир
AU - Иванов, Алексей
PY - 2023
Y1 - 2023
N2 - This study assesses promising field electron sources based on silicon carbide monolithic field emission array (FEA). FEA is fabricated on single-crystal wafers of silicon carbide (0001C) 6H-SiC of n-type conductivity using the technology of two-stage reactive ion etching in SF6/O2/Ar atmosphere. To implement conditions close to breakdown, an experimental setup based on high-voltage narrow pulses generating device GKVI-300 was used. A series of nanosecond voltage pulses with amplitudes from 120 to 250 kV was generated. To study the characteristics of the FEA in the pre-breakdown state, the beam of field emitted electrons was separated from the ion torch or cathode plasma, formed in the following breakdown phases, by placing a 50-μm-thick titanium foil under zero potential into the interelectrode gap. Current-voltage characteristics of peak-currents vs. peak-voltages passing through the foil are close to rectilinear in the Fowler-Nordheim coordinates. The current-voltage characteristics plotted for each of the pulses along increasing and decreasing branches show a discrepancy (hysteresis). After the experiments, the silicon carbide cathode FEA was studied in a scanning electron microscope. Keywords: field electron emission, field emitter array, silicon carbide, pre-breakdown, high-voltage narrow pulses.
AB - This study assesses promising field electron sources based on silicon carbide monolithic field emission array (FEA). FEA is fabricated on single-crystal wafers of silicon carbide (0001C) 6H-SiC of n-type conductivity using the technology of two-stage reactive ion etching in SF6/O2/Ar atmosphere. To implement conditions close to breakdown, an experimental setup based on high-voltage narrow pulses generating device GKVI-300 was used. A series of nanosecond voltage pulses with amplitudes from 120 to 250 kV was generated. To study the characteristics of the FEA in the pre-breakdown state, the beam of field emitted electrons was separated from the ion torch or cathode plasma, formed in the following breakdown phases, by placing a 50-μm-thick titanium foil under zero potential into the interelectrode gap. Current-voltage characteristics of peak-currents vs. peak-voltages passing through the foil are close to rectilinear in the Fowler-Nordheim coordinates. The current-voltage characteristics plotted for each of the pulses along increasing and decreasing branches show a discrepancy (hysteresis). After the experiments, the silicon carbide cathode FEA was studied in a scanning electron microscope. Keywords: field electron emission, field emitter array, silicon carbide, pre-breakdown, high-voltage narrow pulses.
UR - https://journals.ioffe.ru/articles/55946
U2 - 10.21883/TP.2023.04.55946.257-22
DO - 10.21883/TP.2023.04.55946.257-22
M3 - Article
VL - 68
SP - 531
EP - 537
JO - Technical Physics
JF - Technical Physics
SN - 1063-7842
IS - 4
ER -
ID: 108335552