Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
Calculation of flat field diode characteristics accounting for the influence of a controlling magnetic field on a spatial charge of emitted electrons in the relativistic approximation. / Egorov, N. V.; Yakovlev, B. V.
в: Surface Investigation X-Ray, Synchrotron and Neutron Techniques, Том 15, № 11, 01.12.2000, стр. 1693-1698.Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
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TY - JOUR
T1 - Calculation of flat field diode characteristics accounting for the influence of a controlling magnetic field on a spatial charge of emitted electrons in the relativistic approximation
AU - Egorov, N. V.
AU - Yakovlev, B. V.
PY - 2000/12/1
Y1 - 2000/12/1
N2 - The influence of the 'shunting effect' of the near-surface region of the spatial charge by the spatial charge localized in a vacuum spacing, field electron emitter-anode, and the changes of its configuration under the action of the controlling magnetic field on emission characteristics of metallic cathodes have been theoretically analyzed. As a result of the numerical experiment we have obtained: the current-voltage dependences of the field emission diode with the tungsten cathode and the distribution of the potential in the diode in the presence of the transversal magnetic field.
AB - The influence of the 'shunting effect' of the near-surface region of the spatial charge by the spatial charge localized in a vacuum spacing, field electron emitter-anode, and the changes of its configuration under the action of the controlling magnetic field on emission characteristics of metallic cathodes have been theoretically analyzed. As a result of the numerical experiment we have obtained: the current-voltage dependences of the field emission diode with the tungsten cathode and the distribution of the potential in the diode in the presence of the transversal magnetic field.
UR - http://www.scopus.com/inward/record.url?scp=0034484320&partnerID=8YFLogxK
M3 - Article
AN - SCOPUS:0034484320
VL - 15
SP - 1693
EP - 1698
JO - ПОВЕРХНОСТЬ. РЕНТГЕНОВСКИЕ, СИНХРОТРОННЫЕ И НЕЙТРОННЫЕ ИССЛЕДОВАНИЯ
JF - ПОВЕРХНОСТЬ. РЕНТГЕНОВСКИЕ, СИНХРОТРОННЫЕ И НЕЙТРОННЫЕ ИССЛЕДОВАНИЯ
SN - 1027-4510
IS - 11
ER -
ID: 52377432