Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
Atomic composition and stability of Langmuir–Blodgett monolayers based on siloxane dimer of quaterthiophene on the surface of polycrystalline gold. / Komolov, A. S.; Lazneva, E. F.; Zhukov, Yu M.; Pshenichnyuk, S. A.; Agina, E. V.; Dominskii, D. I.; Anisimov, D. S.; Parashchuk, D. Yu.
в: Physics of the Solid State, Том 59, № 12, 01.12.2017, стр. 2491-2496.Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
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TY - JOUR
T1 - Atomic composition and stability of Langmuir–Blodgett monolayers based on siloxane dimer of quaterthiophene on the surface of polycrystalline gold
AU - Komolov, A. S.
AU - Lazneva, E. F.
AU - Zhukov, Yu M.
AU - Pshenichnyuk, S. A.
AU - Agina, E. V.
AU - Dominskii, D. I.
AU - Anisimov, D. S.
AU - Parashchuk, D. Yu
PY - 2017/12/1
Y1 - 2017/12/1
N2 - Atomic composition of monolayers based on siloxane dimer of quaterthiophene deposited by Langmuir–Blodgett technique on a silicon dioxide surface partially covered by gold film and the stability of these monolayers upon surface treatment by Ar+ ions bombardment have been studied. Experimental results for the chemical composition of a series of studied surfaces have been obtained by X-ray photoelectron spectroscopy (XPS) by recording XPS spectra of C 1s, O 1s, S 2p, and Au 4f core levels. The relative concentration of Au and Si substrate atoms and the composition of ex situ prepared surface under study were determined within 10–15%, which indicates that Langmuir–Blodgett monolayers based on siloxane dimer of quaterthiophene form continuous coating in a considerable extent. Prior to the treatment of the studied surface by Ar+ ions bombardment, carbon- and oxygen-containing surface adsorbates provided a considerable contribution to the results of XPS measurements. The surface cleaning by Ar+ ions with energy 3 keV at electric current through sample of ~1 μA in several 30-s steps has led to the etching of surface adsorbates and next Langmuir–Blodgett films of the siloxane dimer of quaterthiophene.
AB - Atomic composition of monolayers based on siloxane dimer of quaterthiophene deposited by Langmuir–Blodgett technique on a silicon dioxide surface partially covered by gold film and the stability of these monolayers upon surface treatment by Ar+ ions bombardment have been studied. Experimental results for the chemical composition of a series of studied surfaces have been obtained by X-ray photoelectron spectroscopy (XPS) by recording XPS spectra of C 1s, O 1s, S 2p, and Au 4f core levels. The relative concentration of Au and Si substrate atoms and the composition of ex situ prepared surface under study were determined within 10–15%, which indicates that Langmuir–Blodgett monolayers based on siloxane dimer of quaterthiophene form continuous coating in a considerable extent. Prior to the treatment of the studied surface by Ar+ ions bombardment, carbon- and oxygen-containing surface adsorbates provided a considerable contribution to the results of XPS measurements. The surface cleaning by Ar+ ions with energy 3 keV at electric current through sample of ~1 μA in several 30-s steps has led to the etching of surface adsorbates and next Langmuir–Blodgett films of the siloxane dimer of quaterthiophene.
UR - http://www.scopus.com/inward/record.url?scp=85038110853&partnerID=8YFLogxK
U2 - 10.1134/S1063783417120228
DO - 10.1134/S1063783417120228
M3 - Article
AN - SCOPUS:85038110853
VL - 59
SP - 2491
EP - 2496
JO - Physics of the Solid State
JF - Physics of the Solid State
SN - 1063-7834
IS - 12
ER -
ID: 13722398