TY - JOUR

T1 - An interference method for studying a substance in the vicinity of its critical point

AU - Domelunksen, V. G.

AU - Krylov, I. R.

AU - Polyanskaya, G. A.

AU - Tsygankov, M. A.

PY - 2004/7/1

Y1 - 2004/7/1

N2 - An interference method for measuring certain parameters of a substance in the vicinity of the critical state is proposed. The essence of the method is to decipher the interference pattern arising upon grazing incidence of a laser beam on a curved liquid-vapor interface. The deciphering allows one to determine the difference between the refractive indices of the two phases and the scaling factor of the wetting meniscus shape. This, in turn, makes it possible to calculate the critical exponents for the temperature dependences of the surface tension and the difference in the densities of the two phases. The ratio of these critical exponents for xenon, measured in the paper, is 3.81 ± 0.03.

AB - An interference method for measuring certain parameters of a substance in the vicinity of the critical state is proposed. The essence of the method is to decipher the interference pattern arising upon grazing incidence of a laser beam on a curved liquid-vapor interface. The deciphering allows one to determine the difference between the refractive indices of the two phases and the scaling factor of the wetting meniscus shape. This, in turn, makes it possible to calculate the critical exponents for the temperature dependences of the surface tension and the difference in the densities of the two phases. The ratio of these critical exponents for xenon, measured in the paper, is 3.81 ± 0.03.

UR - http://www.scopus.com/inward/record.url?scp=4944238011&partnerID=8YFLogxK

U2 - 10.1134/1.1781294

DO - 10.1134/1.1781294

M3 - Article

AN - SCOPUS:4944238011

VL - 97

SP - 136

EP - 140

JO - OPTICS AND SPECTROSCOPY

JF - OPTICS AND SPECTROSCOPY

SN - 0030-400X

IS - 1

ER -