X-ray studies of aluminum alloy of the Al-Mg-Si system subjected to SPD processing

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X-ray studies of aluminum alloy of the Al-Mg-Si system subjected to SPD processing. / Sitdikov, V.D.; Murashkin, M.Y.; Khasanov, M.R.; Kasatkin, I.A.; Chizhov, P.S.; Bobruk, E.V.

2014. Paper presented at 6th International Conference on Nanomaterials by Severe Plastic Deformation (NanoSPD), Metz, France.

Research output: Contribution to conference › Paper › peer-review

Author

Sitdikov, V.D. ; Murashkin, M.Y. ; Khasanov, M.R. ; Kasatkin, I.A. ; Chizhov, P.S. ; Bobruk, E.V. / X-ray studies of aluminum alloy of the Al-Mg-Si system subjected to SPD processing. Paper presented at 6th International Conference on Nanomaterials by Severe Plastic Deformation (NanoSPD), Metz, France.7 p.

BibTeX

@conference{5f4c8cd5b2c8467c918a35d065f0c504,

title = "X-ray studies of aluminum alloy of the Al-Mg-Si system subjected to SPD processing",

abstract = "Recently it has been established that during high pressure torsion dynamic aging takes place in aluminum Al-Mg-Si alloys resulting in formation of nanosized particles of strengthening phases in the aluminum matrix, which greatly improves the electrical conductivity and strength properties. In the present paper structural characterization of ultrafine-grained (UFG) samples of aluminum 6201 alloy produced by severe plastic deformation (SPD) was performed using X-ray diffraction analysis. As a result, structure features (lattice parameter, size of coherent scattering domains) after dynamic aging of UFG samples were determined. The size and distribution of second-phase particles in the Al matrix were assessed with regard to HPT regimes. Impact of the size and distribution of the formed secondary phases on the strength, ductility and electrical conductivity is discussed.",

author = "V.D. Sitdikov and M.Y. Murashkin and M.R. Khasanov and I.A. Kasatkin and P.S. Chizhov and E.V. Bobruk",

year = "2014",

doi = "10.1088/1757-899X/63/1/012087",

language = "Английский",

note = "null ; Conference date: 30-06-2014 Through 04-07-2014",

}

RIS

TY - CONF

T1 - X-ray studies of aluminum alloy of the Al-Mg-Si system subjected to SPD processing

AU - Sitdikov, V.D.

AU - Murashkin, M.Y.

AU - Khasanov, M.R.

AU - Kasatkin, I.A.

AU - Chizhov, P.S.

AU - Bobruk, E.V.

PY - 2014

Y1 - 2014

N2 - Recently it has been established that during high pressure torsion dynamic aging takes place in aluminum Al-Mg-Si alloys resulting in formation of nanosized particles of strengthening phases in the aluminum matrix, which greatly improves the electrical conductivity and strength properties. In the present paper structural characterization of ultrafine-grained (UFG) samples of aluminum 6201 alloy produced by severe plastic deformation (SPD) was performed using X-ray diffraction analysis. As a result, structure features (lattice parameter, size of coherent scattering domains) after dynamic aging of UFG samples were determined. The size and distribution of second-phase particles in the Al matrix were assessed with regard to HPT regimes. Impact of the size and distribution of the formed secondary phases on the strength, ductility and electrical conductivity is discussed.

AB - Recently it has been established that during high pressure torsion dynamic aging takes place in aluminum Al-Mg-Si alloys resulting in formation of nanosized particles of strengthening phases in the aluminum matrix, which greatly improves the electrical conductivity and strength properties. In the present paper structural characterization of ultrafine-grained (UFG) samples of aluminum 6201 alloy produced by severe plastic deformation (SPD) was performed using X-ray diffraction analysis. As a result, structure features (lattice parameter, size of coherent scattering domains) after dynamic aging of UFG samples were determined. The size and distribution of second-phase particles in the Al matrix were assessed with regard to HPT regimes. Impact of the size and distribution of the formed secondary phases on the strength, ductility and electrical conductivity is discussed.

U2 - 10.1088/1757-899X/63/1/012087

DO - 10.1088/1757-899X/63/1/012087

M3 - материалы

Y2 - 30 June 2014 through 4 July 2014

ER -

ID: 87956490