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Ultrasmall-angle X-ray scattering analysis of photonic crystal structure. / Grigor'Eva, N. A.; Grigor'Ev, S. V.; Mistonov, A. A.; Vasil'Eva, A. V.; Tret'Yakov, Yu D.

In: Journal of Experimental and Theoretical Physics, Vol. 109, No. 1, 01.07.2009, p. 29-34.

Research output: Contribution to journalArticlepeer-review

Harvard

Grigor'Eva, NA, Grigor'Ev, SV, Mistonov, AA, Vasil'Eva, AV & Tret'Yakov, YD 2009, 'Ultrasmall-angle X-ray scattering analysis of photonic crystal structure', Journal of Experimental and Theoretical Physics, vol. 109, no. 1, pp. 29-34. https://doi.org/10.1134/S1063776109070048

APA

Grigor'Eva, N. A., Grigor'Ev, S. V., Mistonov, A. A., Vasil'Eva, A. V., & Tret'Yakov, Y. D. (2009). Ultrasmall-angle X-ray scattering analysis of photonic crystal structure. Journal of Experimental and Theoretical Physics, 109(1), 29-34. https://doi.org/10.1134/S1063776109070048

Vancouver

Grigor'Eva NA, Grigor'Ev SV, Mistonov AA, Vasil'Eva AV, Tret'Yakov YD. Ultrasmall-angle X-ray scattering analysis of photonic crystal structure. Journal of Experimental and Theoretical Physics. 2009 Jul 1;109(1):29-34. https://doi.org/10.1134/S1063776109070048

Author

Grigor'Eva, N. A. ; Grigor'Ev, S. V. ; Mistonov, A. A. ; Vasil'Eva, A. V. ; Tret'Yakov, Yu D. / Ultrasmall-angle X-ray scattering analysis of photonic crystal structure. In: Journal of Experimental and Theoretical Physics. 2009 ; Vol. 109, No. 1. pp. 29-34.

BibTeX

@article{2a80efd4021b455ba217ada87cd4bf4e,
title = "Ultrasmall-angle X-ray scattering analysis of photonic crystal structure",
abstract = "The results of an ultrasmall-angle X-ray scattering study of iron(III) oxide inverse opal thin films are presented. The photonic crystals examined are shown to have fcc structure with amount of stacking faults varying among the samples. The method used in this study makes it possible to easily distinguish between samples with predominantly twinned fcc structure and nearly perfect fcc stacking. The difference observed between samples fabricated under identical conditions is attributed to random layer stacking in the self-assembled colloidal crystals used as templates for fabricating the inverse opals. The present method provides a versatile tool for analyzing photonic crystal structure in studies of inverse opals made of various materials, colloidal crystals, and three-dimensional photonic crystals of other types.",
author = "Grigor'Eva, {N. A.} and Grigor'Ev, {S. V.} and Mistonov, {A. A.} and Vasil'Eva, {A. V.} and Tret'Yakov, {Yu D.}",
year = "2009",
month = jul,
day = "1",
doi = "10.1134/S1063776109070048",
language = "English",
volume = "109",
pages = "29--34",
journal = "Journal of Experimental and Theoretical Physics",
issn = "1063-7761",
publisher = "МАИК {"}Наука/Интерпериодика{"}",
number = "1",

}

RIS

TY - JOUR

T1 - Ultrasmall-angle X-ray scattering analysis of photonic crystal structure

AU - Grigor'Eva, N. A.

AU - Grigor'Ev, S. V.

AU - Mistonov, A. A.

AU - Vasil'Eva, A. V.

AU - Tret'Yakov, Yu D.

PY - 2009/7/1

Y1 - 2009/7/1

N2 - The results of an ultrasmall-angle X-ray scattering study of iron(III) oxide inverse opal thin films are presented. The photonic crystals examined are shown to have fcc structure with amount of stacking faults varying among the samples. The method used in this study makes it possible to easily distinguish between samples with predominantly twinned fcc structure and nearly perfect fcc stacking. The difference observed between samples fabricated under identical conditions is attributed to random layer stacking in the self-assembled colloidal crystals used as templates for fabricating the inverse opals. The present method provides a versatile tool for analyzing photonic crystal structure in studies of inverse opals made of various materials, colloidal crystals, and three-dimensional photonic crystals of other types.

AB - The results of an ultrasmall-angle X-ray scattering study of iron(III) oxide inverse opal thin films are presented. The photonic crystals examined are shown to have fcc structure with amount of stacking faults varying among the samples. The method used in this study makes it possible to easily distinguish between samples with predominantly twinned fcc structure and nearly perfect fcc stacking. The difference observed between samples fabricated under identical conditions is attributed to random layer stacking in the self-assembled colloidal crystals used as templates for fabricating the inverse opals. The present method provides a versatile tool for analyzing photonic crystal structure in studies of inverse opals made of various materials, colloidal crystals, and three-dimensional photonic crystals of other types.

UR - http://www.scopus.com/inward/record.url?scp=69249137947&partnerID=8YFLogxK

U2 - 10.1134/S1063776109070048

DO - 10.1134/S1063776109070048

M3 - Article

AN - SCOPUS:69249137947

VL - 109

SP - 29

EP - 34

JO - Journal of Experimental and Theoretical Physics

JF - Journal of Experimental and Theoretical Physics

SN - 1063-7761

IS - 1

ER -

ID: 42872280