Standard

Tracking Dark Excitons with Exciton Polaritons in Semiconductor Microcavities. / Schmidt, D.; Berger, B.; Kahlert, M.; Bayer, M.; Schneider, C.; Höfling, S.; Sedov, E. S.; Kavokin, A. V. ; Assmann, M.

In: Physical Review Letters, Vol. 122, No. 4, 047403, 01.02.2019.

Research output: Contribution to journalArticlepeer-review

Harvard

Schmidt, D, Berger, B, Kahlert, M, Bayer, M, Schneider, C, Höfling, S, Sedov, ES, Kavokin, AV & Assmann, M 2019, 'Tracking Dark Excitons with Exciton Polaritons in Semiconductor Microcavities', Physical Review Letters, vol. 122, no. 4, 047403. https://doi.org/10.1103/PhysRevLett.122.047403

APA

Schmidt, D., Berger, B., Kahlert, M., Bayer, M., Schneider, C., Höfling, S., Sedov, E. S., Kavokin, A. V., & Assmann, M. (2019). Tracking Dark Excitons with Exciton Polaritons in Semiconductor Microcavities. Physical Review Letters, 122(4), [047403]. https://doi.org/10.1103/PhysRevLett.122.047403

Vancouver

Schmidt D, Berger B, Kahlert M, Bayer M, Schneider C, Höfling S et al. Tracking Dark Excitons with Exciton Polaritons in Semiconductor Microcavities. Physical Review Letters. 2019 Feb 1;122(4). 047403. https://doi.org/10.1103/PhysRevLett.122.047403

Author

Schmidt, D. ; Berger, B. ; Kahlert, M. ; Bayer, M. ; Schneider, C. ; Höfling, S. ; Sedov, E. S. ; Kavokin, A. V. ; Assmann, M. / Tracking Dark Excitons with Exciton Polaritons in Semiconductor Microcavities. In: Physical Review Letters. 2019 ; Vol. 122, No. 4.

BibTeX

@article{4a003fdf11c84d1483d1501b9a3e5d9b,
title = "Tracking Dark Excitons with Exciton Polaritons in Semiconductor Microcavities",
abstract = "Dark excitons are of fundamental importance for a wide variety of processes in semiconductors but are difficult to investigate using optical techniques due to their weak interaction with light fields. We reveal and characterize dark excitons nonresonantly injected into a semiconductor microcavity structure containing InGaAs/GaAs quantum wells by a gated train of eight 100 fs pulses separated by 13 ns by monitoring their interactions with the bright lower polariton mode. We find a surprisingly long dark exciton lifetime of more than 20 ns, which is longer than the time delay between two consecutive pulses. This creates a memory effect that we clearly observe through the variation of the time-resolved transmission signal. We propose a rate equation model that provides a quantitative agreement with the experimental data.",
author = "D. Schmidt and B. Berger and M. Kahlert and M. Bayer and C. Schneider and S. H{\"o}fling and Sedov, {E. S.} and A. V. Kavokin and M. Assmann",
year = "2019",
month = feb,
day = "1",
doi = "10.1103/PhysRevLett.122.047403",
language = "English",
volume = "122",
journal = "Physical Review Letters",
issn = "0031-9007",
publisher = "American Physical Society",
number = "4",

}

RIS

TY - JOUR

T1 - Tracking Dark Excitons with Exciton Polaritons in Semiconductor Microcavities

AU - Schmidt, D.

AU - Berger, B.

AU - Kahlert, M.

AU - Bayer, M.

AU - Schneider, C.

AU - Höfling, S.

AU - Sedov, E. S.

AU - Kavokin, A. V.

AU - Assmann, M.

PY - 2019/2/1

Y1 - 2019/2/1

N2 - Dark excitons are of fundamental importance for a wide variety of processes in semiconductors but are difficult to investigate using optical techniques due to their weak interaction with light fields. We reveal and characterize dark excitons nonresonantly injected into a semiconductor microcavity structure containing InGaAs/GaAs quantum wells by a gated train of eight 100 fs pulses separated by 13 ns by monitoring their interactions with the bright lower polariton mode. We find a surprisingly long dark exciton lifetime of more than 20 ns, which is longer than the time delay between two consecutive pulses. This creates a memory effect that we clearly observe through the variation of the time-resolved transmission signal. We propose a rate equation model that provides a quantitative agreement with the experimental data.

AB - Dark excitons are of fundamental importance for a wide variety of processes in semiconductors but are difficult to investigate using optical techniques due to their weak interaction with light fields. We reveal and characterize dark excitons nonresonantly injected into a semiconductor microcavity structure containing InGaAs/GaAs quantum wells by a gated train of eight 100 fs pulses separated by 13 ns by monitoring their interactions with the bright lower polariton mode. We find a surprisingly long dark exciton lifetime of more than 20 ns, which is longer than the time delay between two consecutive pulses. This creates a memory effect that we clearly observe through the variation of the time-resolved transmission signal. We propose a rate equation model that provides a quantitative agreement with the experimental data.

UR - http://www.scopus.com/inward/record.url?scp=85060998083&partnerID=8YFLogxK

U2 - 10.1103/PhysRevLett.122.047403

DO - 10.1103/PhysRevLett.122.047403

M3 - Article

VL - 122

JO - Physical Review Letters

JF - Physical Review Letters

SN - 0031-9007

IS - 4

M1 - 047403

ER -

ID: 49361595