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Time-Resolving X-Ray Acoustic Diffractometry of Perspective Crystalline Materials under Uniaxial Mechanical Loads. / Akkuratov, V. I.; Blagov, A. E.; Pisarevskii, Yu V.; Targonsky, A. V.; Eliovich, Ya A.; Moiseeva, N. A.; Kovalchuk, M. V.

In: Journal of Communications Technology and Electronics, Vol. 66, No. 10, 01.10.2021, p. 1184-1188.

Research output: Contribution to journal › Article › peer-review

Harvard

Akkuratov, VI, Blagov, AE, Pisarevskii, YV, Targonsky, AV, Eliovich, YA, Moiseeva, NA & Kovalchuk, MV 2021, 'Time-Resolving X-Ray Acoustic Diffractometry of Perspective Crystalline Materials under Uniaxial Mechanical Loads', Journal of Communications Technology and Electronics, vol. 66, no. 10, pp. 1184-1188. https://doi.org/10.1134/s1064226921100016

APA

Akkuratov, V. I., Blagov, A. E., Pisarevskii, Y. V., Targonsky, A. V., Eliovich, Y. A., Moiseeva, N. A., & Kovalchuk, M. V. (2021). Time-Resolving X-Ray Acoustic Diffractometry of Perspective Crystalline Materials under Uniaxial Mechanical Loads. Journal of Communications Technology and Electronics, 66(10), 1184-1188. https://doi.org/10.1134/s1064226921100016

Vancouver

Akkuratov VI, Blagov AE, Pisarevskii YV, Targonsky AV, Eliovich YA, Moiseeva NA et al. Time-Resolving X-Ray Acoustic Diffractometry of Perspective Crystalline Materials under Uniaxial Mechanical Loads. Journal of Communications Technology and Electronics. 2021 Oct 1;66(10):1184-1188. https://doi.org/10.1134/s1064226921100016

Author

Akkuratov, V. I. ; Blagov, A. E. ; Pisarevskii, Yu V. ; Targonsky, A. V. ; Eliovich, Ya A. ; Moiseeva, N. A. ; Kovalchuk, M. V. / Time-Resolving X-Ray Acoustic Diffractometry of Perspective Crystalline Materials under Uniaxial Mechanical Loads. In: Journal of Communications Technology and Electronics. 2021 ; Vol. 66, No. 10. pp. 1184-1188.

BibTeX

@article{a866ae0c13e646a4807dc7b5605ff271,
title = "Time-Resolving X-Ray Acoustic Diffractometry of Perspective Crystalline Materials under Uniaxial Mechanical Loads",
abstract = "A time-resolving technique is proposed for studying promising crystalline materials for components of micro- and optoelectronic devices under conditions of external mechanical loading using a specially designed X-ray acoustic diffractometer. The technique makes it possible to carry out fast (up to milliseconds) measurements of diffraction reflection curves of the crystals under study using a special module to create a uniaxial mechanical load. The possibility of researching reversible and irreversible processes occurring in crystals under external influences is shown, which can be used for diagnostics and predicting the fault tolerance of electronic components made on their basis.",
author = "Akkuratov, {V. I.} and Blagov, {A. E.} and Pisarevskii, {Yu V.} and Targonsky, {A. V.} and Eliovich, {Ya A.} and Moiseeva, {N. A.} and Kovalchuk, {M. V.}",
note = "Akkuratov, V.I., Blagov, A.E., Pisarevskii, Y.V. et al. Time-Resolving X-Ray Acoustic Diffractometry of Perspective Crystalline Materials under Uniaxial Mechanical Loads. J. Commun. Technol. Electron. 66, 1184–1188 (2021). https://doi.org/10.1134/S1064226921100016",
year = "2021",
month = oct,
day = "1",
doi = "10.1134/s1064226921100016",
language = "English",
volume = "66",
pages = "1184--1188",
journal = "Journal of Communications Technology and Electronics",
issn = "1064-2269",
publisher = "МАИК {"}Наука/Интерпериодика{"}",
number = "10",

}

RIS

TY - JOUR

T1 - Time-Resolving X-Ray Acoustic Diffractometry of Perspective Crystalline Materials under Uniaxial Mechanical Loads

AU - Akkuratov, V. I.

AU - Blagov, A. E.

AU - Pisarevskii, Yu V.

AU - Targonsky, A. V.

AU - Eliovich, Ya A.

AU - Moiseeva, N. A.

AU - Kovalchuk, M. V.

N1 - Akkuratov, V.I., Blagov, A.E., Pisarevskii, Y.V. et al. Time-Resolving X-Ray Acoustic Diffractometry of Perspective Crystalline Materials under Uniaxial Mechanical Loads. J. Commun. Technol. Electron. 66, 1184–1188 (2021). https://doi.org/10.1134/S1064226921100016

PY - 2021/10/1

Y1 - 2021/10/1

N2 - A time-resolving technique is proposed for studying promising crystalline materials for components of micro- and optoelectronic devices under conditions of external mechanical loading using a specially designed X-ray acoustic diffractometer. The technique makes it possible to carry out fast (up to milliseconds) measurements of diffraction reflection curves of the crystals under study using a special module to create a uniaxial mechanical load. The possibility of researching reversible and irreversible processes occurring in crystals under external influences is shown, which can be used for diagnostics and predicting the fault tolerance of electronic components made on their basis.

AB - A time-resolving technique is proposed for studying promising crystalline materials for components of micro- and optoelectronic devices under conditions of external mechanical loading using a specially designed X-ray acoustic diffractometer. The technique makes it possible to carry out fast (up to milliseconds) measurements of diffraction reflection curves of the crystals under study using a special module to create a uniaxial mechanical load. The possibility of researching reversible and irreversible processes occurring in crystals under external influences is shown, which can be used for diagnostics and predicting the fault tolerance of electronic components made on their basis.

UR - http://www.scopus.com/inward/record.url?scp=85117352634&partnerID=8YFLogxK

UR - https://www.mendeley.com/catalogue/784ab435-445f-3e06-aa11-591e3e593321/

U2 - 10.1134/s1064226921100016

DO - 10.1134/s1064226921100016

M3 - Article

AN - SCOPUS:85117352634

VL - 66

SP - 1184

EP - 1188

JO - Journal of Communications Technology and Electronics

JF - Journal of Communications Technology and Electronics

SN - 1064-2269

IS - 10

ER -

ID: 88194949