The study of the oxidation of thin Ti films by neutron reflectometry

In: Journal of Physics: Conference Series, Vol. 340, 2012, p. 012086.

Research output: Contribution to journal › Article › peer-review

Matveev, V. ; Pleshanov, N. ; Bulkin, A. ; Syromyatnikov, V. / The study of the oxidation of thin Ti films by neutron reflectometry. In: Journal of Physics: Conference Series. 2012 ; Vol. 340. pp. 012086.

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title = "The study of the oxidation of thin Ti films by neutron reflectometry",

author = "V. Matveev and N. Pleshanov and A. Bulkin and V. Syromyatnikov",

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AU - Pleshanov, N.

AU - Bulkin, A.

AU - Syromyatnikov, V.

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