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The influence of phase transitions in quartz on the properties of thin films of metal oxides formed on its surface. / Leonov, N. B.; Koroleva, A. V.; Zhizhin, E. V.; Kasatkin, I. A.; Maslova, N. A.

In: Optical and Quantum Electronics, Vol. 56, No. 8, 06.07.2024.

Research output: Contribution to journal › Article › peer-review

Harvard

Leonov, NB, Koroleva, AV, Zhizhin, EV, Kasatkin, IA & Maslova, NA 2024, 'The influence of phase transitions in quartz on the properties of thin films of metal oxides formed on its surface', Optical and Quantum Electronics, vol. 56, no. 8. https://doi.org/10.1007/s11082-024-07226-5

APA

Leonov, N. B., Koroleva, A. V., Zhizhin, E. V., Kasatkin, I. A., & Maslova, N. A. (2024). The influence of phase transitions in quartz on the properties of thin films of metal oxides formed on its surface. Optical and Quantum Electronics, 56(8). https://doi.org/10.1007/s11082-024-07226-5

Vancouver

Leonov NB, Koroleva AV, Zhizhin EV, Kasatkin IA, Maslova NA. The influence of phase transitions in quartz on the properties of thin films of metal oxides formed on its surface. Optical and Quantum Electronics. 2024 Jul 6;56(8). https://doi.org/10.1007/s11082-024-07226-5

Author

Leonov, N. B. ; Koroleva, A. V. ; Zhizhin, E. V. ; Kasatkin, I. A. ; Maslova, N. A. / The influence of phase transitions in quartz on the properties of thin films of metal oxides formed on its surface. In: Optical and Quantum Electronics. 2024 ; Vol. 56, No. 8.

BibTeX

@article{a23378b055714bf2b910f3d3e76129f7,
title = "The influence of phase transitions in quartz on the properties of thin films of metal oxides formed on its surface",
abstract = "Anomalous changes were found in the properties of thin films of zinc and cadmium oxides on fused quartz substrates during oxidation. Depending on the oxidation temperature, absorption shifted towards shorter wavelengths in a narrow temperature range, and the band gap increased. The effect was not reversible. On other substrates (sapphire, MgO) the same films demonstrated no sharp changes in the absorption spectra during oxidation at up to 800 °C. XPS (X-ray Photoelectron Spectroscopy) and XRD (X-ray Diffraction) measurements revealed the changes in the film composition—the appearance of silicon atoms and a relative decrease in the number of metal atoms which could be responsible for the effects observed. Phase transitions in quartz and the effect of lattice vibrations on its surface structure (soft mode) could result in the compositional change. Additionally, EM (Electron Microscopy) and XRD data showed an increase in the crystallinity of the samples in the same narrow temperature range.",
keywords = "Absorption spectrum, Diffusion, Fused quartz, Metal oxides, Phase transition",
author = "Leonov, {N. B.} and Koroleva, {A. V.} and Zhizhin, {E. V.} and Kasatkin, {I. A.} and Maslova, {N. A.}",
year = "2024",
month = jul,
day = "6",
doi = "10.1007/s11082-024-07226-5",
language = "русский",
volume = "56",
journal = "Optical and Quantum Electronics",
issn = "0306-8919",
publisher = "Springer Nature",
number = "8",

}

RIS

TY - JOUR

T1 - The influence of phase transitions in quartz on the properties of thin films of metal oxides formed on its surface

AU - Leonov, N. B.

AU - Koroleva, A. V.

AU - Zhizhin, E. V.

AU - Kasatkin, I. A.

AU - Maslova, N. A.

PY - 2024/7/6

Y1 - 2024/7/6

N2 - Anomalous changes were found in the properties of thin films of zinc and cadmium oxides on fused quartz substrates during oxidation. Depending on the oxidation temperature, absorption shifted towards shorter wavelengths in a narrow temperature range, and the band gap increased. The effect was not reversible. On other substrates (sapphire, MgO) the same films demonstrated no sharp changes in the absorption spectra during oxidation at up to 800 °C. XPS (X-ray Photoelectron Spectroscopy) and XRD (X-ray Diffraction) measurements revealed the changes in the film composition—the appearance of silicon atoms and a relative decrease in the number of metal atoms which could be responsible for the effects observed. Phase transitions in quartz and the effect of lattice vibrations on its surface structure (soft mode) could result in the compositional change. Additionally, EM (Electron Microscopy) and XRD data showed an increase in the crystallinity of the samples in the same narrow temperature range.

AB - Anomalous changes were found in the properties of thin films of zinc and cadmium oxides on fused quartz substrates during oxidation. Depending on the oxidation temperature, absorption shifted towards shorter wavelengths in a narrow temperature range, and the band gap increased. The effect was not reversible. On other substrates (sapphire, MgO) the same films demonstrated no sharp changes in the absorption spectra during oxidation at up to 800 °C. XPS (X-ray Photoelectron Spectroscopy) and XRD (X-ray Diffraction) measurements revealed the changes in the film composition—the appearance of silicon atoms and a relative decrease in the number of metal atoms which could be responsible for the effects observed. Phase transitions in quartz and the effect of lattice vibrations on its surface structure (soft mode) could result in the compositional change. Additionally, EM (Electron Microscopy) and XRD data showed an increase in the crystallinity of the samples in the same narrow temperature range.

KW - Absorption spectrum

KW - Diffusion

KW - Fused quartz

KW - Metal oxides

KW - Phase transition

UR - https://www.mendeley.com/catalogue/d534b0c9-478d-38d1-a243-a0f24fb9dc37/

U2 - 10.1007/s11082-024-07226-5

DO - 10.1007/s11082-024-07226-5

M3 - статья

VL - 56

JO - Optical and Quantum Electronics

JF - Optical and Quantum Electronics

SN - 0306-8919

IS - 8

ER -

ID: 121642492