Standard

The applicability of Raman spectroscopy for estimation of interfaces thickness in the AlN/GaN superlattices. / Pankin, D.V.; Smirnov, M.B.

In: ST. PETERSBURG POLYTECHNIC UNIVERSITY JOURNAL: PHYSICS AND MATHEMATICS, Vol. 2, No. 2, 2016, p. 83-90.

Research output: Contribution to journal › Article › peer-review

Harvard

Pankin, DV & Smirnov, MB 2016, 'The applicability of Raman spectroscopy for estimation of interfaces thickness in the AlN/GaN superlattices', ST. PETERSBURG POLYTECHNIC UNIVERSITY JOURNAL: PHYSICS AND MATHEMATICS, vol. 2, no. 2, pp. 83-90. https://doi.org/10.1016/j.spjpm.2016.05.014

APA

Pankin, D. V., & Smirnov, M. B. (2016). The applicability of Raman spectroscopy for estimation of interfaces thickness in the AlN/GaN superlattices. ST. PETERSBURG POLYTECHNIC UNIVERSITY JOURNAL: PHYSICS AND MATHEMATICS, 2(2), 83-90. https://doi.org/10.1016/j.spjpm.2016.05.014

Vancouver

Pankin DV, Smirnov MB. The applicability of Raman spectroscopy for estimation of interfaces thickness in the AlN/GaN superlattices. ST. PETERSBURG POLYTECHNIC UNIVERSITY JOURNAL: PHYSICS AND MATHEMATICS. 2016;2(2):83-90. https://doi.org/10.1016/j.spjpm.2016.05.014

Author

Pankin, D.V. ; Smirnov, M.B. / The applicability of Raman spectroscopy for estimation of interfaces thickness in the AlN/GaN superlattices. In: ST. PETERSBURG POLYTECHNIC UNIVERSITY JOURNAL: PHYSICS AND MATHEMATICS. 2016 ; Vol. 2, No. 2. pp. 83-90.

BibTeX

@article{5d9d53950a9a480a8bd6296a9bf64ea8,
title = "The applicability of Raman spectroscopy for estimation of interfaces thickness in the AlN/GaN superlattices",
author = "D.V. Pankin and M.B. Smirnov",
year = "2016",
doi = "10.1016/j.spjpm.2016.05.014",
language = "не определен",
volume = "2",
pages = "83--90",
journal = "НАУЧНО-ТЕХНИЧЕСКИЕ ВЕДОМОСТИ САНКТ-ПЕТЕРБУРГСКОГО ГОСУДАРСТВЕННОГО ПОЛИТЕХНИЧЕСКОГО УНИВЕРСИТЕТА. ФИЗИКО-МАТЕМАТИЧЕСКИЕ НАУКИ",
issn = "2304-9782",
publisher = "Издательство Санкт-Петербургского Государственного Политехнического Университета",
number = "2",

}

RIS

TY - JOUR

T1 - The applicability of Raman spectroscopy for estimation of interfaces thickness in the AlN/GaN superlattices

AU - Pankin, D.V.

AU - Smirnov, M.B.

PY - 2016

Y1 - 2016

U2 - 10.1016/j.spjpm.2016.05.014

DO - 10.1016/j.spjpm.2016.05.014

M3 - статья

VL - 2

SP - 83

EP - 90

JO - НАУЧНО-ТЕХНИЧЕСКИЕ ВЕДОМОСТИ САНКТ-ПЕТЕРБУРГСКОГО ГОСУДАРСТВЕННОГО ПОЛИТЕХНИЧЕСКОГО УНИВЕРСИТЕТА. ФИЗИКО-МАТЕМАТИЧЕСКИЕ НАУКИ

JF - НАУЧНО-ТЕХНИЧЕСКИЕ ВЕДОМОСТИ САНКТ-ПЕТЕРБУРГСКОГО ГОСУДАРСТВЕННОГО ПОЛИТЕХНИЧЕСКОГО УНИВЕРСИТЕТА. ФИЗИКО-МАТЕМАТИЧЕСКИЕ НАУКИ

SN - 2304-9782

IS - 2

ER -

ID: 7619340