Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review
The 0D quantum field theory: Multiple integrals via background field formalism. / Bagaev, Aleksei A.; Pis'mak, Yuri M.
Days on Diffraction 2016: Proceedings of the International Conference . Institute of Electrical and Electronics Engineers Inc., 2016. p. 41-45.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review
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TY - GEN
T1 - The 0D quantum field theory: Multiple integrals via background field formalism
AU - Bagaev, Aleksei A.
AU - Pis'mak, Yuri M.
PY - 2016
Y1 - 2016
N2 - A variant of ``0D quantum field theory'' alternative of random matrices is proposed. The Feynman's path integrals are directly replaced by usual multiple Riemannian ones over finite-dimensional real Euclidean space. In this scheme we realized L. D. Faddeev's version of background field formalism. As an example the $\varphi^4$ model is discussed. Necessary Feynman diagram technics is constructed. If diagrams in each order of the perturbation theory (or the loop expansion) are calculated, so, we have an asymptotic series for S-matrix generating functional. We suppose that the method will help calculate asymptotic expansions for special kind of integrals.
AB - A variant of ``0D quantum field theory'' alternative of random matrices is proposed. The Feynman's path integrals are directly replaced by usual multiple Riemannian ones over finite-dimensional real Euclidean space. In this scheme we realized L. D. Faddeev's version of background field formalism. As an example the $\varphi^4$ model is discussed. Necessary Feynman diagram technics is constructed. If diagrams in each order of the perturbation theory (or the loop expansion) are calculated, so, we have an asymptotic series for S-matrix generating functional. We suppose that the method will help calculate asymptotic expansions for special kind of integrals.
KW - background field formalism
KW - $\phi^4$ model
KW - diagram technics
KW - asymptotic series
UR - https://ieeexplore.ieee.org/document/7756810/
U2 - 10.1109/DD.2016.7756810
DO - 10.1109/DD.2016.7756810
M3 - Conference contribution
SN - 9781509058013
SP - 41
EP - 45
BT - Days on Diffraction 2016
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2016 International Conference Days on Diffraction, DD 2016
Y2 - 27 June 2016 through 1 July 2016
ER -
ID: 7595027