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Technology for monitoring the surface emission inhomogeneity in plasma electronics devices. / Mustafaev, Alexandr; Grabovskiy, Artem; Сухомлинов, Владимир Сергеевич; Shtoda, E.

In: Journal of Applied Physics, Vol. 136, No. 20, 203303 , 2024.

Research output: Contribution to journal › Article › peer-review

Harvard

Mustafaev, A, Grabovskiy, A, Сухомлинов, ВС & Shtoda, E 2024, 'Technology for monitoring the surface emission inhomogeneity in plasma electronics devices', Journal of Applied Physics, vol. 136, no. 20, 203303 . https://doi.org/10.1063/5.0233459

APA

Mustafaev, A., Grabovskiy, A., Сухомлинов, В. С., & Shtoda, E. (2024). Technology for monitoring the surface emission inhomogeneity in plasma electronics devices. Journal of Applied Physics, 136(20), [203303 ]. https://doi.org/10.1063/5.0233459

Vancouver

Mustafaev A, Grabovskiy A, Сухомлинов ВС, Shtoda E. Technology for monitoring the surface emission inhomogeneity in plasma electronics devices. Journal of Applied Physics. 2024; 136(20). 203303 . https://doi.org/10.1063/5.0233459

Author

Mustafaev, Alexandr ; Grabovskiy, Artem ; Сухомлинов, Владимир Сергеевич ; Shtoda, E. / Technology for monitoring the surface emission inhomogeneity in plasma electronics devices. In: Journal of Applied Physics. 2024 ; Vol. 136, No. 20.

BibTeX

@article{4bda5daa583142b6be36056c67c4ec96,
title = "Technology for monitoring the surface emission inhomogeneity in plasma electronics devices",
author = "Alexandr Mustafaev and Artem Grabovskiy and Сухомлинов, {Владимир Сергеевич} and E. Shtoda",
year = "2024",
doi = "10.1063/5.0233459",
language = "English",
volume = " 136",
journal = "Journal of Applied Physics",
issn = "0021-8979",
publisher = "American Institute of Physics",
number = "20",

}

RIS

TY - JOUR

T1 - Technology for monitoring the surface emission inhomogeneity in plasma electronics devices

AU - Mustafaev, Alexandr

AU - Grabovskiy, Artem

AU - Сухомлинов, Владимир Сергеевич

AU - Shtoda, E.

PY - 2024

Y1 - 2024

U2 - 10.1063/5.0233459

DO - 10.1063/5.0233459

M3 - Article

VL - 136

JO - Journal of Applied Physics

JF - Journal of Applied Physics

SN - 0021-8979

IS - 20

M1 - 203303

ER -

ID: 128478752