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Technique for investigating the spatial structure of thin films at a nanolevel. / Egorov, N.V.; Karpov, A.G.; Antonova, L.I.; Fedorov, A.G.; Trofimov, V.V.; Antonov, S.R.

In: Journal of Surface Investigation X-Ray, Synchrotron and Neutron Techniques, Vol. 5, No. 5, 10.2011, p. 992-995.

Research output: Contribution to journal › Article › peer-review

Harvard

Egorov, NV, Karpov, AG, Antonova, LI, Fedorov, AG, Trofimov, VV & Antonov, SR 2011, 'Technique for investigating the spatial structure of thin films at a nanolevel', Journal of Surface Investigation X-Ray, Synchrotron and Neutron Techniques, vol. 5, no. 5, pp. 992-995. https://doi.org/10.1134/S1027451011100089, https://doi.org/10.1134/S1027451011100089

APA

Egorov, N. V., Karpov, A. G., Antonova, L. I., Fedorov, A. G., Trofimov, V. V., & Antonov, S. R. (2011). Technique for investigating the spatial structure of thin films at a nanolevel. Journal of Surface Investigation X-Ray, Synchrotron and Neutron Techniques, 5(5), 992-995. https://doi.org/10.1134/S1027451011100089, https://doi.org/10.1134/S1027451011100089

Vancouver

Egorov NV, Karpov AG, Antonova LI, Fedorov AG, Trofimov VV, Antonov SR. Technique for investigating the spatial structure of thin films at a nanolevel. Journal of Surface Investigation X-Ray, Synchrotron and Neutron Techniques. 2011 Oct;5(5):992-995. https://doi.org/10.1134/S1027451011100089, https://doi.org/10.1134/S1027451011100089

Author

Egorov, N.V. ; Karpov, A.G. ; Antonova, L.I. ; Fedorov, A.G. ; Trofimov, V.V. ; Antonov, S.R. / Technique for investigating the spatial structure of thin films at a nanolevel. In: Journal of Surface Investigation X-Ray, Synchrotron and Neutron Techniques. 2011 ; Vol. 5, No. 5. pp. 992-995.

BibTeX

@article{507c245ca59840808ccc37799f38a1ea,
title = "Technique for investigating the spatial structure of thin films at a nanolevel",
abstract = "A holographic microscope is intended for investigation and visual observation of nanoobjects that are thin metal films or macromolecules. A module providing for the experimental research of such objects has been designed and built. The optimal thickness of the metal films has been estimated. Software for processing the interference patterns with the aim of obtaining a holographic image of nanoobjects has been developed.",
author = "N.V. Egorov and A.G. Karpov and L.I. Antonova and A.G. Fedorov and V.V. Trofimov and S.R. Antonov",
year = "2011",
month = oct,
doi = "10.1134/S1027451011100089",
language = "Английский",
volume = "5",
pages = "992--995",
journal = "ПОВЕРХНОСТЬ. РЕНТГЕНОВСКИЕ, СИНХРОТРОННЫЕ И НЕЙТРОННЫЕ ИССЛЕДОВАНИЯ",
issn = "1027-4510",
publisher = "МАИК {"}Наука/Интерпериодика{"}",
number = "5",

}

RIS

TY - JOUR

T1 - Technique for investigating the spatial structure of thin films at a nanolevel

AU - Egorov, N.V.

AU - Karpov, A.G.

AU - Antonova, L.I.

AU - Fedorov, A.G.

AU - Trofimov, V.V.

AU - Antonov, S.R.

PY - 2011/10

Y1 - 2011/10

N2 - A holographic microscope is intended for investigation and visual observation of nanoobjects that are thin metal films or macromolecules. A module providing for the experimental research of such objects has been designed and built. The optimal thickness of the metal films has been estimated. Software for processing the interference patterns with the aim of obtaining a holographic image of nanoobjects has been developed.

AB - A holographic microscope is intended for investigation and visual observation of nanoobjects that are thin metal films or macromolecules. A module providing for the experimental research of such objects has been designed and built. The optimal thickness of the metal films has been estimated. Software for processing the interference patterns with the aim of obtaining a holographic image of nanoobjects has been developed.

U2 - 10.1134/S1027451011100089

DO - 10.1134/S1027451011100089

M3 - статья

VL - 5

SP - 992

EP - 995

JO - ПОВЕРХНОСТЬ. РЕНТГЕНОВСКИЕ, СИНХРОТРОННЫЕ И НЕЙТРОННЫЕ ИССЛЕДОВАНИЯ

JF - ПОВЕРХНОСТЬ. РЕНТГЕНОВСКИЕ, СИНХРОТРОННЫЕ И НЕЙТРОННЫЕ ИССЛЕДОВАНИЯ

SN - 1027-4510

IS - 5

ER -

ID: 5527770