Research output: Contribution to journal › Article › peer-review
Study of the resistive switching and electrode degradation in Al/TiO2 /FTO thin films upon thermal treatment in reducing atmosphere. / Illarionov, G. A.; Kolchanov, D. S.; Chrishtop, V. V.; Kasatkin, I. A.; Vinogradov, A. V.; Morozov, M. I.
In: Nanosystems: Physics, Chemistry, Mathematics, Vol. 12, No. 6, 12.2021, p. 783-791.Research output: Contribution to journal › Article › peer-review
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TY - JOUR
T1 - Study of the resistive switching and electrode degradation in Al/TiO2 /FTO thin films upon thermal treatment in reducing atmosphere
AU - Illarionov, G. A.
AU - Kolchanov, D. S.
AU - Chrishtop, V. V.
AU - Kasatkin, I. A.
AU - Vinogradov, A. V.
AU - Morozov, M. I.
N1 - Publisher Copyright: © 2021, ITMO University. All rights reserved.
PY - 2021/12
Y1 - 2021/12
N2 - Application of sol-gel derived titania nanoparticles in memristive thin film devices has been a subject of several studies. The reported data on the functional properties and stability of such devices scatter considerably. Meanwhile, the role of post-fabrication treatment, such as annealing in reducing atmosphere, is still poorly investigated for this class of devices. In this study, the effects of thermal annealing in a reducing atmosphere on the resistive switching behavior and the morphological changes of the top electrode during the electroforming process have been systematically addressed for the samples of Al/TiO2 /FTO thin film memristors prepared using sol-gel derived titania. Manifestations of several phenomena affecting the functional stability of these thin films, such as electrode delamination and collapse due to formation of gas bubbles, appearance of electrochemical patterns at the electrode surface, and morphological changes induced by the electroforming process have been systematically established in relation with the various conditions of thermal treatment in a reducing atmosphere.
AB - Application of sol-gel derived titania nanoparticles in memristive thin film devices has been a subject of several studies. The reported data on the functional properties and stability of such devices scatter considerably. Meanwhile, the role of post-fabrication treatment, such as annealing in reducing atmosphere, is still poorly investigated for this class of devices. In this study, the effects of thermal annealing in a reducing atmosphere on the resistive switching behavior and the morphological changes of the top electrode during the electroforming process have been systematically addressed for the samples of Al/TiO2 /FTO thin film memristors prepared using sol-gel derived titania. Manifestations of several phenomena affecting the functional stability of these thin films, such as electrode delamination and collapse due to formation of gas bubbles, appearance of electrochemical patterns at the electrode surface, and morphological changes induced by the electroforming process have been systematically established in relation with the various conditions of thermal treatment in a reducing atmosphere.
KW - Electrode degradation
KW - Memristors
KW - TiO
UR - http://www.scopus.com/inward/record.url?scp=85122157928&partnerID=8YFLogxK
U2 - 10.17586/2220-8054-2021-12-6-783-791
DO - 10.17586/2220-8054-2021-12-6-783-791
M3 - Article
AN - SCOPUS:85122157928
VL - 12
SP - 783
EP - 791
JO - Nanosystems: Physics, Chemistry, Mathematics
JF - Nanosystems: Physics, Chemistry, Mathematics
SN - 2220-8054
IS - 6
ER -
ID: 94004918