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Study of the defect structure of paratellurite crystal using multiwave diffraction and normal X-ray diffractometry methods. / Marchenkov, N. V.; Blagov, A. E.; Lomonov, B. A.; Pisarevsky, Yu V.; Kovalchuk, M. V.

In: Crystallography Reports, Vol. 58, No. 2, 03.2013, p. 201-203.

Research output: Contribution to journal › Article › peer-review

Harvard

Marchenkov, NV, Blagov, AE, Lomonov, BA, Pisarevsky, YV & Kovalchuk, MV 2013, 'Study of the defect structure of paratellurite crystal using multiwave diffraction and normal X-ray diffractometry methods', Crystallography Reports, vol. 58, no. 2, pp. 201-203. https://doi.org/10.1134/S1063774513020168

APA

Marchenkov, N. V., Blagov, A. E., Lomonov, B. A., Pisarevsky, Y. V., & Kovalchuk, M. V. (2013). Study of the defect structure of paratellurite crystal using multiwave diffraction and normal X-ray diffractometry methods. Crystallography Reports, 58(2), 201-203. https://doi.org/10.1134/S1063774513020168

Vancouver

Marchenkov NV, Blagov AE, Lomonov BA, Pisarevsky YV, Kovalchuk MV. Study of the defect structure of paratellurite crystal using multiwave diffraction and normal X-ray diffractometry methods. Crystallography Reports. 2013 Mar;58(2):201-203. https://doi.org/10.1134/S1063774513020168

Author

Marchenkov, N. V. ; Blagov, A. E. ; Lomonov, B. A. ; Pisarevsky, Yu V. ; Kovalchuk, M. V. / Study of the defect structure of paratellurite crystal using multiwave diffraction and normal X-ray diffractometry methods. In: Crystallography Reports. 2013 ; Vol. 58, No. 2. pp. 201-203.

BibTeX

@article{7b93c9108c594b5ebd94299a434f826d,
title = "Study of the defect structure of paratellurite crystal using multiwave diffraction and normal X-ray diffractometry methods",
abstract = "Multiwave X-ray diffraction has been used to study the structure of crystalline samples. A cycle of local measurements of rocking curves (RCs) of the (220) and (371) reflections under conditions of multiwave diffraction (MD) has been carried out in a paratellurite crystal. The data obtained are used to compare the sensitivity to structure defects of two-beam diffraction with that of MD, which makes it possible to study the X-ray wave phase. The comparison has revealed a higher ability of the phase-sensitive method to detect defects.",
author = "Marchenkov, {N. V.} and Blagov, {A. E.} and Lomonov, {B. A.} and Pisarevsky, {Yu V.} and Kovalchuk, {M. V.}",
note = "Funding Information: ACKNOWLEDGMENTS This study was supported by the Ministry of Educa tion and Science of the Russian Federation (state contracts nos. 16.523.11.3005, 16.518.11.7026, and 16.740.11.0095) and the Program for Basic Research of the Presidium of the Russian Academy of Sciences no. 24 (subprogram 3.1).",
year = "2013",
month = mar,
doi = "10.1134/S1063774513020168",
language = "English",
volume = "58",
pages = "201--203",
journal = "Crystallography Reports",
issn = "1063-7745",
publisher = "МАИК {"}Наука/Интерпериодика{"}",
number = "2",

}

RIS

TY - JOUR

T1 - Study of the defect structure of paratellurite crystal using multiwave diffraction and normal X-ray diffractometry methods

AU - Marchenkov, N. V.

AU - Blagov, A. E.

AU - Lomonov, B. A.

AU - Pisarevsky, Yu V.

AU - Kovalchuk, M. V.

N1 - Funding Information: ACKNOWLEDGMENTS This study was supported by the Ministry of Educa tion and Science of the Russian Federation (state contracts nos. 16.523.11.3005, 16.518.11.7026, and 16.740.11.0095) and the Program for Basic Research of the Presidium of the Russian Academy of Sciences no. 24 (subprogram 3.1).

PY - 2013/3

Y1 - 2013/3

N2 - Multiwave X-ray diffraction has been used to study the structure of crystalline samples. A cycle of local measurements of rocking curves (RCs) of the (220) and (371) reflections under conditions of multiwave diffraction (MD) has been carried out in a paratellurite crystal. The data obtained are used to compare the sensitivity to structure defects of two-beam diffraction with that of MD, which makes it possible to study the X-ray wave phase. The comparison has revealed a higher ability of the phase-sensitive method to detect defects.

AB - Multiwave X-ray diffraction has been used to study the structure of crystalline samples. A cycle of local measurements of rocking curves (RCs) of the (220) and (371) reflections under conditions of multiwave diffraction (MD) has been carried out in a paratellurite crystal. The data obtained are used to compare the sensitivity to structure defects of two-beam diffraction with that of MD, which makes it possible to study the X-ray wave phase. The comparison has revealed a higher ability of the phase-sensitive method to detect defects.

UR - http://www.scopus.com/inward/record.url?scp=84879581493&partnerID=8YFLogxK

U2 - 10.1134/S1063774513020168

DO - 10.1134/S1063774513020168

M3 - Article

AN - SCOPUS:84879581493

VL - 58

SP - 201

EP - 203

JO - Crystallography Reports

JF - Crystallography Reports

SN - 1063-7745

IS - 2

ER -

ID: 88210245