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Structure of near-electrode dissociation-recombination layers under DC stress. / Chirkov, V.A.; Shaposhnikov, A.M.; Stishkov, Y.K.

Structure of near-electrode dissociation-recombination layers under DC stress. 2015. p. 012032.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

Harvard

Chirkov, VA, Shaposhnikov, AM & Stishkov, YK 2015, Structure of near-electrode dissociation-recombination layers under DC stress. in Structure of near-electrode dissociation-recombination layers under DC stress. pp. 012032. https://doi.org/10.1088/1742-6596/646/1/012032

APA

Chirkov, V. A., Shaposhnikov, A. M., & Stishkov, Y. K. (2015). Structure of near-electrode dissociation-recombination layers under DC stress. In Structure of near-electrode dissociation-recombination layers under DC stress (pp. 012032) https://doi.org/10.1088/1742-6596/646/1/012032

Vancouver

Chirkov VA, Shaposhnikov AM, Stishkov YK. Structure of near-electrode dissociation-recombination layers under DC stress. In Structure of near-electrode dissociation-recombination layers under DC stress. 2015. p. 012032 https://doi.org/10.1088/1742-6596/646/1/012032

Author

Chirkov, V.A. ; Shaposhnikov, A.M. ; Stishkov, Y.K. / Structure of near-electrode dissociation-recombination layers under DC stress. Structure of near-electrode dissociation-recombination layers under DC stress. 2015. pp. 012032

BibTeX

@inproceedings{07ccf21b660f4f2bb88d1936a8ac804f,
title = "Structure of near-electrode dissociation-recombination layers under DC stress",
author = "V.A. Chirkov and A.M. Shaposhnikov and Y.K. Stishkov",
year = "2015",
doi = "10.1088/1742-6596/646/1/012032",
language = "English",
pages = "012032",
booktitle = "Structure of near-electrode dissociation-recombination layers under DC stress",

}

RIS

TY - GEN

T1 - Structure of near-electrode dissociation-recombination layers under DC stress

AU - Chirkov, V.A.

AU - Shaposhnikov, A.M.

AU - Stishkov, Y.K.

PY - 2015

Y1 - 2015

U2 - 10.1088/1742-6596/646/1/012032

DO - 10.1088/1742-6596/646/1/012032

M3 - Conference contribution

SP - 012032

BT - Structure of near-electrode dissociation-recombination layers under DC stress

ER -

ID: 3974276