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Structural, electrical and gas-sensitive properties of Cr2O3 thin films. / Almaev, Aleksei V.; Kushnarev, Bogdan O.; Chernikov, Evgeny V.; Novikov, Vadim A.; Korusenko, Petr. M.; Nesov, Sergey N.

In: Superlattices and Microstructures, Vol. 151, 106835, 03.2021.

Research output: Contribution to journalArticlepeer-review

Harvard

Almaev, AV, Kushnarev, BO, Chernikov, EV, Novikov, VA, Korusenko, PM & Nesov, SN 2021, 'Structural, electrical and gas-sensitive properties of Cr2O3 thin films', Superlattices and Microstructures, vol. 151, 106835. https://doi.org/10.1016/j.spmi.2021.106835

APA

Almaev, A. V., Kushnarev, B. O., Chernikov, E. V., Novikov, V. A., Korusenko, P. M., & Nesov, S. N. (2021). Structural, electrical and gas-sensitive properties of Cr2O3 thin films. Superlattices and Microstructures, 151, [106835]. https://doi.org/10.1016/j.spmi.2021.106835

Vancouver

Almaev AV, Kushnarev BO, Chernikov EV, Novikov VA, Korusenko PM, Nesov SN. Structural, electrical and gas-sensitive properties of Cr2O3 thin films. Superlattices and Microstructures. 2021 Mar;151. 106835. https://doi.org/10.1016/j.spmi.2021.106835

Author

Almaev, Aleksei V. ; Kushnarev, Bogdan O. ; Chernikov, Evgeny V. ; Novikov, Vadim A. ; Korusenko, Petr. M. ; Nesov, Sergey N. / Structural, electrical and gas-sensitive properties of Cr2O3 thin films. In: Superlattices and Microstructures. 2021 ; Vol. 151.

BibTeX

@article{a45f290e99aa432d96d13c0a19fefcbd,
title = "Structural, electrical and gas-sensitive properties of Cr2O3 thin films",
abstract = "Cr2O3 thin films were synthesized by RF magnetron sputtering of a Cr target in an oxygen-argon plasma. The effect of annealing temperature on the structural, electrical, and gas-sensitive properties of the Cr2O3 thin films was studied. According to AFM, SEM, XRD, EDX, XPS, optical spectroscopy and electrical measurements the annealed films were characterized by a polycrystalline structure, high stoichiometry, p-type conductivity and a band gap energy of 3.3 ± 0.2 eV. An increase in the annealing temperature from 350 to 450 °C leads to formation of Cr2O3 grains with a diameter from 30 to 130 nm and to a significant increase in the film electrical resistance. Cr2O3 demonstrated sensitivity to NO2, H2, NH3, vapors of acetone and toluene in the heating temperature range of 25–200 °C. Changing the annealing temperature allows to control the sensitivity of the films to certain gases. Thus, Cr2O3 thin films subjected to annealing at a temperature of 450 °C were characterized by a high response to NH3, while those annealed at a temperature of 400 °C – to toluene vapors and that annealed at 350 °C – to NO2 and acetone vapors. A qualitative model of the sensory effect was proposed.",
keywords = "Chromium oxide, Thin films, Magnetron sputtering, Gas sensors",
author = "Almaev, {Aleksei V.} and Kushnarev, {Bogdan O.} and Chernikov, {Evgeny V.} and Novikov, {Vadim A.} and Korusenko, {Petr. M.} and Nesov, {Sergey N.}",
year = "2021",
month = mar,
doi = "10.1016/j.spmi.2021.106835",
language = "English",
volume = "151",
journal = "Micro and Nanostructures",
issn = "2773-0131",
publisher = "Elsevier",

}

RIS

TY - JOUR

T1 - Structural, electrical and gas-sensitive properties of Cr2O3 thin films

AU - Almaev, Aleksei V.

AU - Kushnarev, Bogdan O.

AU - Chernikov, Evgeny V.

AU - Novikov, Vadim A.

AU - Korusenko, Petr. M.

AU - Nesov, Sergey N.

PY - 2021/3

Y1 - 2021/3

N2 - Cr2O3 thin films were synthesized by RF magnetron sputtering of a Cr target in an oxygen-argon plasma. The effect of annealing temperature on the structural, electrical, and gas-sensitive properties of the Cr2O3 thin films was studied. According to AFM, SEM, XRD, EDX, XPS, optical spectroscopy and electrical measurements the annealed films were characterized by a polycrystalline structure, high stoichiometry, p-type conductivity and a band gap energy of 3.3 ± 0.2 eV. An increase in the annealing temperature from 350 to 450 °C leads to formation of Cr2O3 grains with a diameter from 30 to 130 nm and to a significant increase in the film electrical resistance. Cr2O3 demonstrated sensitivity to NO2, H2, NH3, vapors of acetone and toluene in the heating temperature range of 25–200 °C. Changing the annealing temperature allows to control the sensitivity of the films to certain gases. Thus, Cr2O3 thin films subjected to annealing at a temperature of 450 °C were characterized by a high response to NH3, while those annealed at a temperature of 400 °C – to toluene vapors and that annealed at 350 °C – to NO2 and acetone vapors. A qualitative model of the sensory effect was proposed.

AB - Cr2O3 thin films were synthesized by RF magnetron sputtering of a Cr target in an oxygen-argon plasma. The effect of annealing temperature on the structural, electrical, and gas-sensitive properties of the Cr2O3 thin films was studied. According to AFM, SEM, XRD, EDX, XPS, optical spectroscopy and electrical measurements the annealed films were characterized by a polycrystalline structure, high stoichiometry, p-type conductivity and a band gap energy of 3.3 ± 0.2 eV. An increase in the annealing temperature from 350 to 450 °C leads to formation of Cr2O3 grains with a diameter from 30 to 130 nm and to a significant increase in the film electrical resistance. Cr2O3 demonstrated sensitivity to NO2, H2, NH3, vapors of acetone and toluene in the heating temperature range of 25–200 °C. Changing the annealing temperature allows to control the sensitivity of the films to certain gases. Thus, Cr2O3 thin films subjected to annealing at a temperature of 450 °C were characterized by a high response to NH3, while those annealed at a temperature of 400 °C – to toluene vapors and that annealed at 350 °C – to NO2 and acetone vapors. A qualitative model of the sensory effect was proposed.

KW - Chromium oxide

KW - Thin films

KW - Magnetron sputtering

KW - Gas sensors

UR - http://www.scopus.com/inward/record.url?scp=85100676547&partnerID=8YFLogxK

UR - https://www.mendeley.com/catalogue/0bbee4f4-d42e-3f8a-999a-eeee0242053c/

U2 - 10.1016/j.spmi.2021.106835

DO - 10.1016/j.spmi.2021.106835

M3 - Article

VL - 151

JO - Micro and Nanostructures

JF - Micro and Nanostructures

SN - 2773-0131

M1 - 106835

ER -

ID: 73703777