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Statistical analysis of AFM, TEM and SEM micrographs of fibrils formed by the Sup35 yeast protein. / Соколов, Петр Александрович.

2017. 217 Abstract from PRION 2017 - 14th International Conference Deciphering Neurodegenerative Disorders, Эдинбург, United Kingdom.

Research output: Contribution to conference › Abstract › peer-review

Harvard

Соколов, ПА 2017, 'Statistical analysis of AFM, TEM and SEM micrographs of fibrils formed by the Sup35 yeast protein', PRION 2017 - 14th International Conference Deciphering Neurodegenerative Disorders, Эдинбург, United Kingdom, 23/05/17 - 26/05/17 pp. 217.

APA

Соколов, П. А. (2017). Statistical analysis of AFM, TEM and SEM micrographs of fibrils formed by the Sup35 yeast protein. 217. Abstract from PRION 2017 - 14th International Conference Deciphering Neurodegenerative Disorders, Эдинбург, United Kingdom.

Vancouver

Соколов ПА. Statistical analysis of AFM, TEM and SEM micrographs of fibrils formed by the Sup35 yeast protein. 2017. Abstract from PRION 2017 - 14th International Conference Deciphering Neurodegenerative Disorders, Эдинбург, United Kingdom.

Author

Соколов, Петр Александрович. / Statistical analysis of AFM, TEM and SEM micrographs of fibrils formed by the Sup35 yeast protein. Abstract from PRION 2017 - 14th International Conference Deciphering Neurodegenerative Disorders, Эдинбург, United Kingdom.1 p.

BibTeX

@conference{1a24505a9e254e58a2253450d2f9f976,
title = "Statistical analysis of AFM, TEM and SEM micrographs of fibrils formed by the Sup35 yeast protein",
author = "Соколов, {Петр Александрович}",
year = "2017",
language = "English",
pages = "217",
note = "null ; Conference date: 23-05-2017 Through 26-05-2017",
url = "http://prion2017.org",

}

RIS

TY - CONF

T1 - Statistical analysis of AFM, TEM and SEM micrographs of fibrils formed by the Sup35 yeast protein

AU - Соколов, Петр Александрович

PY - 2017

Y1 - 2017

M3 - Abstract

SP - 217

Y2 - 23 May 2017 through 26 May 2017

ER -

ID: 9231229