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Spin-echo small-angle neutron scattering study of the domain structure of an Ni layer on a Cu substrate. / Grigoriev, Sergey V.; Chetverikov, Yurii O.; Zabenkin, Vladimir N.; Kraan, Wicher H.; Rekveldt, M. Theo; Van Dijk, Niels.

In: Journal of Applied Crystallography, Vol. 40, No. SUPPL. 1, 04.2007, p. s111-s115.

Research output: Contribution to journalArticlepeer-review

Harvard

Grigoriev, SV, Chetverikov, YO, Zabenkin, VN, Kraan, WH, Rekveldt, MT & Van Dijk, N 2007, 'Spin-echo small-angle neutron scattering study of the domain structure of an Ni layer on a Cu substrate', Journal of Applied Crystallography, vol. 40, no. SUPPL. 1, pp. s111-s115. https://doi.org/10.1107/S0021889807005249

APA

Grigoriev, S. V., Chetverikov, Y. O., Zabenkin, V. N., Kraan, W. H., Rekveldt, M. T., & Van Dijk, N. (2007). Spin-echo small-angle neutron scattering study of the domain structure of an Ni layer on a Cu substrate. Journal of Applied Crystallography, 40(SUPPL. 1), s111-s115. https://doi.org/10.1107/S0021889807005249

Vancouver

Grigoriev SV, Chetverikov YO, Zabenkin VN, Kraan WH, Rekveldt MT, Van Dijk N. Spin-echo small-angle neutron scattering study of the domain structure of an Ni layer on a Cu substrate. Journal of Applied Crystallography. 2007 Apr;40(SUPPL. 1):s111-s115. https://doi.org/10.1107/S0021889807005249

Author

Grigoriev, Sergey V. ; Chetverikov, Yurii O. ; Zabenkin, Vladimir N. ; Kraan, Wicher H. ; Rekveldt, M. Theo ; Van Dijk, Niels. / Spin-echo small-angle neutron scattering study of the domain structure of an Ni layer on a Cu substrate. In: Journal of Applied Crystallography. 2007 ; Vol. 40, No. SUPPL. 1. pp. s111-s115.

BibTeX

@article{32fdca8acab44573a68159c382e275ba,
title = "Spin-echo small-angle neutron scattering study of the domain structure of an Ni layer on a Cu substrate",
abstract = "Spin-echo small-angle neutron scattering (SESANS) is used to study the magnetic domain structure of an Ni layer electrodeposited onto a Cu substrate. The domain structure of the sample corresponds to the hard-plane model, where the magnetization in the domains is directed perpendicular to the layer; the domain length coincides with the thickness of the layer of the order of 10 μm and its width is of the order of 1 μm. The pair correlation function of the magnetization has been directly measured. It is established that the width of the domain depends linearly on its thickness. The domain structure does not depend on heating at temperatures below TC of nickel. Annealing at T > TC results in a reconstruction of the domain structure with a tendency to the easy-plane model, i.e. with domain magnetization in the plane. The multiple scattering effect is studied and may be taken into account. This experiment demonstrates the possibilities of magnetic SESANS. Some aspects of this novel technique are pointed out.",
keywords = "Hard-plane model, Magnetic domains, SESANS, Spin-echo small-angle neutron scattering",
author = "Grigoriev, {Sergey V.} and Chetverikov, {Yurii O.} and Zabenkin, {Vladimir N.} and Kraan, {Wicher H.} and Rekveldt, {M. Theo} and {Van Dijk}, Niels",
year = "2007",
month = apr,
doi = "10.1107/S0021889807005249",
language = "English",
volume = "40",
pages = "s111--s115",
journal = "Journal of Applied Crystallography",
issn = "0021-8898",
publisher = "International Union of Crystallography",
number = "SUPPL. 1",

}

RIS

TY - JOUR

T1 - Spin-echo small-angle neutron scattering study of the domain structure of an Ni layer on a Cu substrate

AU - Grigoriev, Sergey V.

AU - Chetverikov, Yurii O.

AU - Zabenkin, Vladimir N.

AU - Kraan, Wicher H.

AU - Rekveldt, M. Theo

AU - Van Dijk, Niels

PY - 2007/4

Y1 - 2007/4

N2 - Spin-echo small-angle neutron scattering (SESANS) is used to study the magnetic domain structure of an Ni layer electrodeposited onto a Cu substrate. The domain structure of the sample corresponds to the hard-plane model, where the magnetization in the domains is directed perpendicular to the layer; the domain length coincides with the thickness of the layer of the order of 10 μm and its width is of the order of 1 μm. The pair correlation function of the magnetization has been directly measured. It is established that the width of the domain depends linearly on its thickness. The domain structure does not depend on heating at temperatures below TC of nickel. Annealing at T > TC results in a reconstruction of the domain structure with a tendency to the easy-plane model, i.e. with domain magnetization in the plane. The multiple scattering effect is studied and may be taken into account. This experiment demonstrates the possibilities of magnetic SESANS. Some aspects of this novel technique are pointed out.

AB - Spin-echo small-angle neutron scattering (SESANS) is used to study the magnetic domain structure of an Ni layer electrodeposited onto a Cu substrate. The domain structure of the sample corresponds to the hard-plane model, where the magnetization in the domains is directed perpendicular to the layer; the domain length coincides with the thickness of the layer of the order of 10 μm and its width is of the order of 1 μm. The pair correlation function of the magnetization has been directly measured. It is established that the width of the domain depends linearly on its thickness. The domain structure does not depend on heating at temperatures below TC of nickel. Annealing at T > TC results in a reconstruction of the domain structure with a tendency to the easy-plane model, i.e. with domain magnetization in the plane. The multiple scattering effect is studied and may be taken into account. This experiment demonstrates the possibilities of magnetic SESANS. Some aspects of this novel technique are pointed out.

KW - Hard-plane model

KW - Magnetic domains

KW - SESANS

KW - Spin-echo small-angle neutron scattering

UR - http://www.scopus.com/inward/record.url?scp=34248360740&partnerID=8YFLogxK

U2 - 10.1107/S0021889807005249

DO - 10.1107/S0021889807005249

M3 - Article

AN - SCOPUS:34248360740

VL - 40

SP - s111-s115

JO - Journal of Applied Crystallography

JF - Journal of Applied Crystallography

SN - 0021-8898

IS - SUPPL. 1

ER -

ID: 86430693