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Simulation of field electron emission of C and SiC nanotubes. / Sorokina, V.; Nikiforov, K.

2016 Young Researchers in Vacuum Micro/Nano Electronics (VMNE-YR). Institute of Electrical and Electronics Engineers Inc., 2016.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearch

Harvard

Sorokina, V & Nikiforov, K 2016, Simulation of field electron emission of C and SiC nanotubes. in 2016 Young Researchers in Vacuum Micro/Nano Electronics (VMNE-YR). Institute of Electrical and Electronics Engineers Inc. https://doi.org/10.1109/VMNEYR.2016.7880415

APA

Sorokina, V., & Nikiforov, K. (2016). Simulation of field electron emission of C and SiC nanotubes. In 2016 Young Researchers in Vacuum Micro/Nano Electronics (VMNE-YR) Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/VMNEYR.2016.7880415

Vancouver

Sorokina V, Nikiforov K. Simulation of field electron emission of C and SiC nanotubes. In 2016 Young Researchers in Vacuum Micro/Nano Electronics (VMNE-YR). Institute of Electrical and Electronics Engineers Inc. 2016 https://doi.org/10.1109/VMNEYR.2016.7880415

Author

Sorokina, V. ; Nikiforov, K. / Simulation of field electron emission of C and SiC nanotubes. 2016 Young Researchers in Vacuum Micro/Nano Electronics (VMNE-YR). Institute of Electrical and Electronics Engineers Inc., 2016.

BibTeX

@inproceedings{cd6c5029f4554fb7a0b186fab7dcf431,
title = "Simulation of field electron emission of C and SiC nanotubes",
author = "V. Sorokina and K. Nikiforov",
year = "2016",
doi = "10.1109/VMNEYR.2016.7880415",
language = "не определен",
isbn = "978-1-5090-4605-8",
booktitle = "2016 Young Researchers in Vacuum Micro/Nano Electronics (VMNE-YR)",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
address = "Соединенные Штаты Америки",

}

RIS

TY - GEN

T1 - Simulation of field electron emission of C and SiC nanotubes

AU - Sorokina, V.

AU - Nikiforov, K.

PY - 2016

Y1 - 2016

U2 - 10.1109/VMNEYR.2016.7880415

DO - 10.1109/VMNEYR.2016.7880415

M3 - статья в сборнике материалов конференции

SN - 978-1-5090-4605-8

BT - 2016 Young Researchers in Vacuum Micro/Nano Electronics (VMNE-YR)

PB - Institute of Electrical and Electronics Engineers Inc.

ER -

ID: 7656679