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Sensitivity of the optical polarization measurements in squeezed light. / Sokolov, I. V.; Fofanov, Ja A.

Optics as a Key to High Technology. ed. / Gy Akos; T. Lippenyi; G. Lupkovics; A. Podmaniczky. pt 2. ed. SPIE, 1993. p. 779-780 (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 1983, No. pt 2).

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Harvard

Sokolov, IV & Fofanov, JA 1993, Sensitivity of the optical polarization measurements in squeezed light. in G Akos, T Lippenyi, G Lupkovics & A Podmaniczky (eds), Optics as a Key to High Technology. pt 2 edn, Proceedings of SPIE - The International Society for Optical Engineering, no. pt 2, vol. 1983, SPIE, pp. 779-780, Proceedings of the 16th Congress of the International Commission for Optics, Budapest, Hung, 9/08/93.

APA

Sokolov, I. V., & Fofanov, J. A. (1993). Sensitivity of the optical polarization measurements in squeezed light. In G. Akos, T. Lippenyi, G. Lupkovics, & A. Podmaniczky (Eds.), Optics as a Key to High Technology (pt 2 ed., pp. 779-780). (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 1983, No. pt 2). SPIE.

Vancouver

Sokolov IV, Fofanov JA. Sensitivity of the optical polarization measurements in squeezed light. In Akos G, Lippenyi T, Lupkovics G, Podmaniczky A, editors, Optics as a Key to High Technology. pt 2 ed. SPIE. 1993. p. 779-780. (Proceedings of SPIE - The International Society for Optical Engineering; pt 2).

Author

Sokolov, I. V. ; Fofanov, Ja A. / Sensitivity of the optical polarization measurements in squeezed light. Optics as a Key to High Technology. editor / Gy Akos ; T. Lippenyi ; G. Lupkovics ; A. Podmaniczky. pt 2. ed. SPIE, 1993. pp. 779-780 (Proceedings of SPIE - The International Society for Optical Engineering; pt 2).

BibTeX

@inproceedings{f5d8a094e07a43c6a1e548897671ba35,
title = "Sensitivity of the optical polarization measurements in squeezed light",
abstract = "The photoelastic modulator of phase shift and differential registration scheme have been used in the measurement of optical polarization. Sufficient conditions for the noise suppression below the shot noise level by the use of squeezed states of light in these measurement schemes are presented.",
author = "Sokolov, {I. V.} and Fofanov, {Ja A.}",
note = "Copyright: Copyright 2004 Elsevier B.V., All rights reserved.; Proceedings of the 16th Congress of the International Commission for Optics ; Conference date: 09-08-1993 Through 13-08-1993",
year = "1993",
language = "English",
isbn = "0819412309",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "SPIE",
number = "pt 2",
pages = "779--780",
editor = "Gy Akos and T. Lippenyi and G. Lupkovics and A. Podmaniczky",
booktitle = "Optics as a Key to High Technology",
address = "United States",
edition = "pt 2",

}

RIS

TY - GEN

T1 - Sensitivity of the optical polarization measurements in squeezed light

AU - Sokolov, I. V.

AU - Fofanov, Ja A.

N1 - Copyright: Copyright 2004 Elsevier B.V., All rights reserved.

PY - 1993

Y1 - 1993

N2 - The photoelastic modulator of phase shift and differential registration scheme have been used in the measurement of optical polarization. Sufficient conditions for the noise suppression below the shot noise level by the use of squeezed states of light in these measurement schemes are presented.

AB - The photoelastic modulator of phase shift and differential registration scheme have been used in the measurement of optical polarization. Sufficient conditions for the noise suppression below the shot noise level by the use of squeezed states of light in these measurement schemes are presented.

UR - http://www.scopus.com/inward/record.url?scp=0027800251&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:0027800251

SN - 0819412309

T3 - Proceedings of SPIE - The International Society for Optical Engineering

SP - 779

EP - 780

BT - Optics as a Key to High Technology

A2 - Akos, Gy

A2 - Lippenyi, T.

A2 - Lupkovics, G.

A2 - Podmaniczky, A.

PB - SPIE

T2 - Proceedings of the 16th Congress of the International Commission for Optics

Y2 - 9 August 1993 through 13 August 1993

ER -

ID: 73497238