Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review
Sensitivity of the optical polarization measurements in squeezed light. / Sokolov, I. V.; Fofanov, Ja A.
Optics as a Key to High Technology. ed. / Gy Akos; T. Lippenyi; G. Lupkovics; A. Podmaniczky. pt 2. ed. SPIE, 1993. p. 779-780 (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 1983, No. pt 2).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review
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TY - GEN
T1 - Sensitivity of the optical polarization measurements in squeezed light
AU - Sokolov, I. V.
AU - Fofanov, Ja A.
N1 - Copyright: Copyright 2004 Elsevier B.V., All rights reserved.
PY - 1993
Y1 - 1993
N2 - The photoelastic modulator of phase shift and differential registration scheme have been used in the measurement of optical polarization. Sufficient conditions for the noise suppression below the shot noise level by the use of squeezed states of light in these measurement schemes are presented.
AB - The photoelastic modulator of phase shift and differential registration scheme have been used in the measurement of optical polarization. Sufficient conditions for the noise suppression below the shot noise level by the use of squeezed states of light in these measurement schemes are presented.
UR - http://www.scopus.com/inward/record.url?scp=0027800251&partnerID=8YFLogxK
M3 - Conference contribution
AN - SCOPUS:0027800251
SN - 0819412309
T3 - Proceedings of SPIE - The International Society for Optical Engineering
SP - 779
EP - 780
BT - Optics as a Key to High Technology
A2 - Akos, Gy
A2 - Lippenyi, T.
A2 - Lupkovics, G.
A2 - Podmaniczky, A.
PB - SPIE
T2 - Proceedings of the 16th Congress of the International Commission for Optics
Y2 - 9 August 1993 through 13 August 1993
ER -
ID: 73497238