Scattering of monochromatic X-rays at different incident radiation angles provides quantitative information on physical and chemical properties of plastics

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Scattering of monochromatic X-rays at different incident radiation angles provides quantitative information on physical and chemical properties of plastics. / Aidene, Soraya; Semenov, Valentin; Kirsanov, Denis; Kirsanov, Dmitry ; Panchuk, Vitaly.

In: Measurement: Journal of the International Measurement Confederation, Vol. 172, 108888, 02.2021.

Research output: Contribution to journal › Article › peer-review

BibTeX

@article{b471383f72534af880587e1406674b81,

title = "Scattering of monochromatic X-rays at different incident radiation angles provides quantitative information on physical and chemical properties of plastics",

abstract = "X-ray fluorescence spectroscopy (XRF) is a powerful tool of elemental analysis; however in most of the experimental set-ups it does not allow quantification of the light elements (with atomic number below 11). The use of scattering X-ray radiation as a source of useful analytical information is getting more and more popular in X-ray studies. The common trend in this field is in using the standard XRF instrumentation, where polychromatic incident X-ray radiation and fixed geometry are employed. In this study we explore the opportunity of obtaining valuable physical and chemical information on plastic samples using monochromatic radiation and varying incident radiation angles. The use of machine learning techniques for multivariate regression modeling of scattering radiation spectra allows quantification of certain physical and chemical properties in commercial plastic samples which are normally not available from standard XRF measurements.",

keywords = "Multivariate regression, Plastics, X-ray fluorescence spectroscopy, X-ray scattering",

author = "Soraya Aidene and Valentin Semenov and Denis Kirsanov and Dmitry Kirsanov and Vitaly Panchuk",

note = "Funding Information: Scientific research were performed at the Research park of St.Petersburg State University «Centre for X-ray Diffraction Studies». V.S. and V.P. acknowledge financial support by Ministry of Education and Science of the Russian Federation , Russia, State Project № 075-00780-19-00 (Subject № 0074-2019-0007). Publisher Copyright: {\textcopyright} 2020 Elsevier Ltd Copyright: Copyright 2021 Elsevier B.V., All rights reserved.",

year = "2021",

month = feb,

doi = "10.1016/j.measurement.2020.108888",

language = "English",

volume = "172",

journal = "Industrial Metrology",

issn = "1536-6367",

publisher = "Elsevier",

}

RIS

TY - JOUR

T1 - Scattering of monochromatic X-rays at different incident radiation angles provides quantitative information on physical and chemical properties of plastics

AU - Aidene, Soraya

AU - Semenov, Valentin

AU - Kirsanov, Denis

AU - Kirsanov, Dmitry

AU - Panchuk, Vitaly

N1 - Funding Information: Scientific research were performed at the Research park of St.Petersburg State University «Centre for X-ray Diffraction Studies». V.S. and V.P. acknowledge financial support by Ministry of Education and Science of the Russian Federation , Russia, State Project № 075-00780-19-00 (Subject № 0074-2019-0007). Publisher Copyright: © 2020 Elsevier Ltd Copyright: Copyright 2021 Elsevier B.V., All rights reserved.

PY - 2021/2

Y1 - 2021/2

N2 - X-ray fluorescence spectroscopy (XRF) is a powerful tool of elemental analysis; however in most of the experimental set-ups it does not allow quantification of the light elements (with atomic number below 11). The use of scattering X-ray radiation as a source of useful analytical information is getting more and more popular in X-ray studies. The common trend in this field is in using the standard XRF instrumentation, where polychromatic incident X-ray radiation and fixed geometry are employed. In this study we explore the opportunity of obtaining valuable physical and chemical information on plastic samples using monochromatic radiation and varying incident radiation angles. The use of machine learning techniques for multivariate regression modeling of scattering radiation spectra allows quantification of certain physical and chemical properties in commercial plastic samples which are normally not available from standard XRF measurements.

AB - X-ray fluorescence spectroscopy (XRF) is a powerful tool of elemental analysis; however in most of the experimental set-ups it does not allow quantification of the light elements (with atomic number below 11). The use of scattering X-ray radiation as a source of useful analytical information is getting more and more popular in X-ray studies. The common trend in this field is in using the standard XRF instrumentation, where polychromatic incident X-ray radiation and fixed geometry are employed. In this study we explore the opportunity of obtaining valuable physical and chemical information on plastic samples using monochromatic radiation and varying incident radiation angles. The use of machine learning techniques for multivariate regression modeling of scattering radiation spectra allows quantification of certain physical and chemical properties in commercial plastic samples which are normally not available from standard XRF measurements.

KW - Multivariate regression

KW - Plastics

KW - X-ray fluorescence spectroscopy

KW - X-ray scattering

UR - http://www.scopus.com/inward/record.url?scp=85099235222&partnerID=8YFLogxK

UR - https://www.mendeley.com/catalogue/7023de42-b408-3997-9779-8c99e12a9a34/

U2 - 10.1016/j.measurement.2020.108888

DO - 10.1016/j.measurement.2020.108888

M3 - Article

AN - SCOPUS:85099235222

VL - 172

JO - Industrial Metrology

JF - Industrial Metrology

SN - 1536-6367

M1 - 108888

ER -

ID: 75080755