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Satisfiability certificates verifiable in subexponential time. / Dantsin, Evgeny; Hirsch, Edward A.

Theory and Application of Satisfiability Testing - 14th International Conference, SAT 2011, Proceedings. 2011. p. 19-32 (Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics); Vol. 6695 LNCS).

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Harvard

Dantsin, E & Hirsch, EA 2011, Satisfiability certificates verifiable in subexponential time. in Theory and Application of Satisfiability Testing - 14th International Conference, SAT 2011, Proceedings. Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics), vol. 6695 LNCS, pp. 19-32, 14th International Conference on Theory and Applications of Satisfiability Testing, SAT 2011, Ann Arbor, MI, United States, 19/06/11. https://doi.org/10.1007/978-3-642-21581-0_4

APA

Dantsin, E., & Hirsch, E. A. (2011). Satisfiability certificates verifiable in subexponential time. In Theory and Application of Satisfiability Testing - 14th International Conference, SAT 2011, Proceedings (pp. 19-32). (Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics); Vol. 6695 LNCS). https://doi.org/10.1007/978-3-642-21581-0_4

Vancouver

Dantsin E, Hirsch EA. Satisfiability certificates verifiable in subexponential time. In Theory and Application of Satisfiability Testing - 14th International Conference, SAT 2011, Proceedings. 2011. p. 19-32. (Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)). https://doi.org/10.1007/978-3-642-21581-0_4

Author

Dantsin, Evgeny ; Hirsch, Edward A. / Satisfiability certificates verifiable in subexponential time. Theory and Application of Satisfiability Testing - 14th International Conference, SAT 2011, Proceedings. 2011. pp. 19-32 (Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)).

BibTeX

@inproceedings{ec38a732f80341a188485db413d6c646,
title = "Satisfiability certificates verifiable in subexponential time",
abstract = "It is common to classify satisfiability problems by their time complexity. We consider another complexity measure, namely the length of certificates (witnesses). Our results show that there is a similarity between these two types of complexity if we deal with certificates verifiable in subexponential time. In particular, the well-known result by Impagliazzo and Paturi [IP01] on the dependence of the time complexity of k-SAT on k has its counterpart for the certificate complexity: we show that, assuming the exponential time hypothesis (ETH), the certificate complexity of k-SAT increases infinitely often as k grows. Another example of time-complexity results that can be translated into the certificate-complexity setting is the results of [CIP06] on the relationship between the complexity of k-SAT and the complexity of SAT restricted to formulas of constant clause density. We also consider the certificate complexity of CircuitSAT and observe that if CircuitSAT has subexponential-time verifiable certificates of length cn, where c < 1 is a constant and n is the number of inputs, then an unlikely collapse happens (in particular, ETH fails).",
author = "Evgeny Dantsin and Hirsch, {Edward A.}",
year = "2011",
month = jun,
day = "27",
doi = "10.1007/978-3-642-21581-0_4",
language = "English",
isbn = "9783642215803",
series = "Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)",
pages = "19--32",
booktitle = "Theory and Application of Satisfiability Testing - 14th International Conference, SAT 2011, Proceedings",
note = "14th International Conference on Theory and Applications of Satisfiability Testing, SAT 2011 ; Conference date: 19-06-2011 Through 22-06-2011",

}

RIS

TY - GEN

T1 - Satisfiability certificates verifiable in subexponential time

AU - Dantsin, Evgeny

AU - Hirsch, Edward A.

PY - 2011/6/27

Y1 - 2011/6/27

N2 - It is common to classify satisfiability problems by their time complexity. We consider another complexity measure, namely the length of certificates (witnesses). Our results show that there is a similarity between these two types of complexity if we deal with certificates verifiable in subexponential time. In particular, the well-known result by Impagliazzo and Paturi [IP01] on the dependence of the time complexity of k-SAT on k has its counterpart for the certificate complexity: we show that, assuming the exponential time hypothesis (ETH), the certificate complexity of k-SAT increases infinitely often as k grows. Another example of time-complexity results that can be translated into the certificate-complexity setting is the results of [CIP06] on the relationship between the complexity of k-SAT and the complexity of SAT restricted to formulas of constant clause density. We also consider the certificate complexity of CircuitSAT and observe that if CircuitSAT has subexponential-time verifiable certificates of length cn, where c < 1 is a constant and n is the number of inputs, then an unlikely collapse happens (in particular, ETH fails).

AB - It is common to classify satisfiability problems by their time complexity. We consider another complexity measure, namely the length of certificates (witnesses). Our results show that there is a similarity between these two types of complexity if we deal with certificates verifiable in subexponential time. In particular, the well-known result by Impagliazzo and Paturi [IP01] on the dependence of the time complexity of k-SAT on k has its counterpart for the certificate complexity: we show that, assuming the exponential time hypothesis (ETH), the certificate complexity of k-SAT increases infinitely often as k grows. Another example of time-complexity results that can be translated into the certificate-complexity setting is the results of [CIP06] on the relationship between the complexity of k-SAT and the complexity of SAT restricted to formulas of constant clause density. We also consider the certificate complexity of CircuitSAT and observe that if CircuitSAT has subexponential-time verifiable certificates of length cn, where c < 1 is a constant and n is the number of inputs, then an unlikely collapse happens (in particular, ETH fails).

UR - http://www.scopus.com/inward/record.url?scp=79959488137&partnerID=8YFLogxK

U2 - 10.1007/978-3-642-21581-0_4

DO - 10.1007/978-3-642-21581-0_4

M3 - Conference contribution

AN - SCOPUS:79959488137

SN - 9783642215803

T3 - Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)

SP - 19

EP - 32

BT - Theory and Application of Satisfiability Testing - 14th International Conference, SAT 2011, Proceedings

T2 - 14th International Conference on Theory and Applications of Satisfiability Testing, SAT 2011

Y2 - 19 June 2011 through 22 June 2011

ER -

ID: 49827639