Standard

Sample-in-waveguide geometry for TXRF sensitivity improvement. / Panchuk, Vitaly; Goydenko, Alexander; Grebenyuk, Andrey; Irkaev, Sobir; Legin, Andrey; Kirsanov, Dmitry; Semenov, Valentin.

In: Journal of Analytical Atomic Spectrometry, Vol. 32, No. 6, 01.06.2017, p. 1224-1228.

Research output: Contribution to journal › Article › peer-review

Harvard

Panchuk, V, Goydenko, A, Grebenyuk, A, Irkaev, S, Legin, A, Kirsanov, D & Semenov, V 2017, 'Sample-in-waveguide geometry for TXRF sensitivity improvement', Journal of Analytical Atomic Spectrometry, vol. 32, no. 6, pp. 1224-1228. https://doi.org/10.1039/c7ja00096k

APA

Panchuk, V., Goydenko, A., Grebenyuk, A., Irkaev, S., Legin, A., Kirsanov, D., & Semenov, V. (2017). Sample-in-waveguide geometry for TXRF sensitivity improvement. Journal of Analytical Atomic Spectrometry, 32(6), 1224-1228. https://doi.org/10.1039/c7ja00096k

Vancouver

Panchuk V, Goydenko A, Grebenyuk A, Irkaev S, Legin A, Kirsanov D et al. Sample-in-waveguide geometry for TXRF sensitivity improvement. Journal of Analytical Atomic Spectrometry. 2017 Jun 1;32(6):1224-1228. https://doi.org/10.1039/c7ja00096k

Author

Panchuk, Vitaly ; Goydenko, Alexander ; Grebenyuk, Andrey ; Irkaev, Sobir ; Legin, Andrey ; Kirsanov, Dmitry ; Semenov, Valentin. / Sample-in-waveguide geometry for TXRF sensitivity improvement. In: Journal of Analytical Atomic Spectrometry. 2017 ; Vol. 32, No. 6. pp. 1224-1228.

BibTeX

@article{665d515c29c240b9beee7ac7cec06566,
title = "Sample-in-waveguide geometry for TXRF sensitivity improvement",
abstract = "Total reflection X-ray fluorescence (TXRF) is a rapidly developing trace analysis method due to a number of advantages. It is a fast and multielemental method and does not require complex sample pretreatment. Nevertheless, there are certain drawbacks (especially in the environmental analysis) where TXRF sensitivity is not sufficient and employment of various preconcentration methods is required. The present study suggests a very simple procedure based on a planar waveguide technique, where the sample to be analyzed is placed directly into the waveguide. Waveguide construction is also simple and can be produced in any lab using two standard glass reflectors. Such an approach permits considerable improvement of the signal-to-noise ratio in a spectrum and allows for achievement of detection limits for e.g. Cd and Hg at 0.12 μg L-1 and 0.13 μg L-1 respectively.",
author = "Vitaly Panchuk and Alexander Goydenko and Andrey Grebenyuk and Sobir Irkaev and Andrey Legin and Dmitry Kirsanov and Valentin Semenov",
year = "2017",
month = jun,
day = "1",
doi = "10.1039/c7ja00096k",
language = "English",
volume = "32",
pages = "1224--1228",
journal = "Journal of Analytical Atomic Spectrometry",
issn = "0267-9477",
publisher = "Royal Society of Chemistry",
number = "6",

}

RIS

TY - JOUR

T1 - Sample-in-waveguide geometry for TXRF sensitivity improvement

AU - Panchuk, Vitaly

AU - Goydenko, Alexander

AU - Grebenyuk, Andrey

AU - Irkaev, Sobir

AU - Legin, Andrey

AU - Kirsanov, Dmitry

AU - Semenov, Valentin

PY - 2017/6/1

Y1 - 2017/6/1

N2 - Total reflection X-ray fluorescence (TXRF) is a rapidly developing trace analysis method due to a number of advantages. It is a fast and multielemental method and does not require complex sample pretreatment. Nevertheless, there are certain drawbacks (especially in the environmental analysis) where TXRF sensitivity is not sufficient and employment of various preconcentration methods is required. The present study suggests a very simple procedure based on a planar waveguide technique, where the sample to be analyzed is placed directly into the waveguide. Waveguide construction is also simple and can be produced in any lab using two standard glass reflectors. Such an approach permits considerable improvement of the signal-to-noise ratio in a spectrum and allows for achievement of detection limits for e.g. Cd and Hg at 0.12 μg L-1 and 0.13 μg L-1 respectively.

AB - Total reflection X-ray fluorescence (TXRF) is a rapidly developing trace analysis method due to a number of advantages. It is a fast and multielemental method and does not require complex sample pretreatment. Nevertheless, there are certain drawbacks (especially in the environmental analysis) where TXRF sensitivity is not sufficient and employment of various preconcentration methods is required. The present study suggests a very simple procedure based on a planar waveguide technique, where the sample to be analyzed is placed directly into the waveguide. Waveguide construction is also simple and can be produced in any lab using two standard glass reflectors. Such an approach permits considerable improvement of the signal-to-noise ratio in a spectrum and allows for achievement of detection limits for e.g. Cd and Hg at 0.12 μg L-1 and 0.13 μg L-1 respectively.

UR - http://www.scopus.com/inward/record.url?scp=85021827378&partnerID=8YFLogxK

U2 - 10.1039/c7ja00096k

DO - 10.1039/c7ja00096k

M3 - Article

AN - SCOPUS:85021827378

VL - 32

SP - 1224

EP - 1228

JO - Journal of Analytical Atomic Spectrometry

JF - Journal of Analytical Atomic Spectrometry

SN - 0267-9477

IS - 6

ER -

ID: 9274755