Standard

RietveldToTensor : Program for Processing Powder X-Ray Diffraction Data under Variable Conditions. / Bubnova, R. S.; Firsova, V. A.; Volkov, S. N.; Filatov, S. K.

In: Glass Physics and Chemistry, Vol. 44, No. 1, 01.01.2018, p. 33-40.

Research output: Contribution to journal › Article › peer-review

Harvard

Bubnova, RS, Firsova, VA, Volkov, SN & Filatov, SK 2018, 'RietveldToTensor: Program for Processing Powder X-Ray Diffraction Data under Variable Conditions', Glass Physics and Chemistry, vol. 44, no. 1, pp. 33-40. https://doi.org/10.1134/S1087659618010054

APA

Bubnova, R. S., Firsova, V. A., Volkov, S. N., & Filatov, S. K. (2018). RietveldToTensor: Program for Processing Powder X-Ray Diffraction Data under Variable Conditions. Glass Physics and Chemistry, 44(1), 33-40. https://doi.org/10.1134/S1087659618010054

Vancouver

Bubnova RS, Firsova VA, Volkov SN, Filatov SK. RietveldToTensor: Program for Processing Powder X-Ray Diffraction Data under Variable Conditions. Glass Physics and Chemistry. 2018 Jan 1;44(1):33-40. https://doi.org/10.1134/S1087659618010054

Author

Bubnova, R. S. ; Firsova, V. A. ; Volkov, S. N. ; Filatov, S. K. / RietveldToTensor : Program for Processing Powder X-Ray Diffraction Data under Variable Conditions. In: Glass Physics and Chemistry. 2018 ; Vol. 44, No. 1. pp. 33-40.

BibTeX

@article{c05130ab2ef44792946ce14a5a991135,
title = "RietveldToTensor: Program for Processing Powder X-Ray Diffraction Data under Variable Conditions",
abstract = "The RietveldToTensor program is designed to study crystal lattice deformations using the Rietveld method from the X-ray powder diffraction data gathered under varying physical and chemical conditions. Using the program, it is possible to determine the tensor of thermal expansion, compressibility, or chemical deformations of the material. The program runs on the Microsoft Windows 7 and higher platforms.",
keywords = "crystallographic software, high-temperature X-ray powder diffraction, Rietveld method",
author = "Bubnova, {R. S.} and Firsova, {V. A.} and Volkov, {S. N.} and Filatov, {S. K.}",
year = "2018",
month = jan,
day = "1",
doi = "10.1134/S1087659618010054",
language = "English",
volume = "44",
pages = "33--40",
journal = "Glass Physics and Chemistry",
issn = "1087-6596",
publisher = "МАИК {"}Наука/Интерпериодика{"}",
number = "1",

}

RIS

TY - JOUR

T1 - RietveldToTensor

T2 - Program for Processing Powder X-Ray Diffraction Data under Variable Conditions

AU - Bubnova, R. S.

AU - Firsova, V. A.

AU - Volkov, S. N.

AU - Filatov, S. K.

PY - 2018/1/1

Y1 - 2018/1/1

N2 - The RietveldToTensor program is designed to study crystal lattice deformations using the Rietveld method from the X-ray powder diffraction data gathered under varying physical and chemical conditions. Using the program, it is possible to determine the tensor of thermal expansion, compressibility, or chemical deformations of the material. The program runs on the Microsoft Windows 7 and higher platforms.

AB - The RietveldToTensor program is designed to study crystal lattice deformations using the Rietveld method from the X-ray powder diffraction data gathered under varying physical and chemical conditions. Using the program, it is possible to determine the tensor of thermal expansion, compressibility, or chemical deformations of the material. The program runs on the Microsoft Windows 7 and higher platforms.

KW - crystallographic software

KW - high-temperature X-ray powder diffraction

KW - Rietveld method

UR - http://www.scopus.com/inward/record.url?scp=85043454736&partnerID=8YFLogxK

U2 - 10.1134/S1087659618010054

DO - 10.1134/S1087659618010054

M3 - Article

AN - SCOPUS:85043454736

VL - 44

SP - 33

EP - 40

JO - Glass Physics and Chemistry

JF - Glass Physics and Chemistry

SN - 1087-6596

IS - 1

ER -

ID: 53956590