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Relaxation dynamics of Mn2+ intraion excitation in Cd0.5Mn0.5Te : Dependence on the optical pumping level. / Agekyan, V. F.; Vasil'ev, N. N.; Serov, A. Yu; Filosofov, N. G.; Yakimovich, V. N.

In: Physics of the Solid State, Vol. 43, No. 6, 01.09.2001, p. 1626-1632.

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Harvard

Agekyan, VF, Vasil'ev, NN, Serov, AY, Filosofov, NG & Yakimovich, VN 2001, 'Relaxation dynamics of Mn2+ intraion excitation in Cd0.5Mn0.5Te: Dependence on the optical pumping level', Physics of the Solid State, vol. 43, no. 6, pp. 1626-1632.

APA

Vancouver

Author

Agekyan, V. F. ; Vasil'ev, N. N. ; Serov, A. Yu ; Filosofov, N. G. ; Yakimovich, V. N. / Relaxation dynamics of Mn2+ intraion excitation in Cd0.5Mn0.5Te : Dependence on the optical pumping level. In: Physics of the Solid State. 2001 ; Vol. 43, No. 6. pp. 1626-1632.

BibTeX

@article{ff1212957d684ca29c6d44bef74bc46f,
title = "Relaxation dynamics of Mn2+ intraion excitation in Cd0.5Mn0.5Te: Dependence on the optical pumping level",
abstract = "A study is reported of the Mn2+ intracenter 3d luminescence in a dilute Cd0.5Mn0.5Te magnetic semiconductor at pulsed excitations of up to 3.5 MW/cm2. At high excitation levels and at a temperature of 77 K, the kinetics varies strongly over the emission band profile. The luminescence decay curve can be resolved into a fast and a delayed component, which correspond to the excitation of extended and localized states in the manganese ion system. The fast relaxation of the extended states is largely determined by the up-conversion. As the temperature is lowered, the contribution of the fast component at the center of the emission band and in its low-energy wing decreases because of the weakening role of the extended states lying above the mobility edge.",
author = "Agekyan, {V. F.} and Vasil'ev, {N. N.} and Serov, {A. Yu} and Filosofov, {N. G.} and Yakimovich, {V. N.}",
year = "2001",
month = sep,
day = "1",
language = "English",
volume = "43",
pages = "1626--1632",
journal = "Physics of the Solid State",
issn = "1063-7834",
publisher = "МАИК {"}Наука/Интерпериодика{"}",
number = "6",

}

RIS

TY - JOUR

T1 - Relaxation dynamics of Mn2+ intraion excitation in Cd0.5Mn0.5Te

T2 - Dependence on the optical pumping level

AU - Agekyan, V. F.

AU - Vasil'ev, N. N.

AU - Serov, A. Yu

AU - Filosofov, N. G.

AU - Yakimovich, V. N.

PY - 2001/9/1

Y1 - 2001/9/1

N2 - A study is reported of the Mn2+ intracenter 3d luminescence in a dilute Cd0.5Mn0.5Te magnetic semiconductor at pulsed excitations of up to 3.5 MW/cm2. At high excitation levels and at a temperature of 77 K, the kinetics varies strongly over the emission band profile. The luminescence decay curve can be resolved into a fast and a delayed component, which correspond to the excitation of extended and localized states in the manganese ion system. The fast relaxation of the extended states is largely determined by the up-conversion. As the temperature is lowered, the contribution of the fast component at the center of the emission band and in its low-energy wing decreases because of the weakening role of the extended states lying above the mobility edge.

AB - A study is reported of the Mn2+ intracenter 3d luminescence in a dilute Cd0.5Mn0.5Te magnetic semiconductor at pulsed excitations of up to 3.5 MW/cm2. At high excitation levels and at a temperature of 77 K, the kinetics varies strongly over the emission band profile. The luminescence decay curve can be resolved into a fast and a delayed component, which correspond to the excitation of extended and localized states in the manganese ion system. The fast relaxation of the extended states is largely determined by the up-conversion. As the temperature is lowered, the contribution of the fast component at the center of the emission band and in its low-energy wing decreases because of the weakening role of the extended states lying above the mobility edge.

UR - http://www.scopus.com/inward/record.url?scp=0035457886&partnerID=8YFLogxK

M3 - Article

VL - 43

SP - 1626

EP - 1632

JO - Physics of the Solid State

JF - Physics of the Solid State

SN - 1063-7834

IS - 6

ER -

ID: 36150364